| |
Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT |
2022 |
Physical Review C |
105 |
055501 - 8pp |
|
|
|
NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Lopez, F.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
Demonstration of neutrinoless double beta decay searches in gaseous xenon with NEXT |
2023 |
Journal of High Energy Physics |
09 |
190 - 35pp |
|
|
|
NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Simon, A.; Sorel, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Yahlali, N. |
Measurement of radon-induced backgrounds in the NEXT double beta decay experiment |
2018 |
Journal of High Energy Physics |
10 |
112 - 27pp |
|
|
|
NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Sorel, M.; Uson, A.; Alvarez, V; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Yahlali, N. |
Radiogenic backgrounds in the NEXT double beta decay experiment |
2019 |
Journal of High Energy Physics |
10 |
051 - 26pp |
|
|
|
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |
|
