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Author
NEXT Collaboration (Novella, P. et al)
;
Carcel, S.
;
Carrion, J.V.
;
Diaz, J.
;
Martin-Albo, J.
;
Martinez, A.
;
Martinez-Vara, M.
;
Muñoz Vidal, J.
;
Palmeiro, B.
;
Querol, M.
;
Romo-Luque, C.
;
Sorel, M.
;
Uson, A.
;
Yahlali, N.
Title
Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT
Type
Journal Article
Year
2022
Publication
Physical Review C
Abbreviated Journal
Phys. Rev. C
Volume
105
Issue
5
Pages
055501 - 8pp
Keywords
Abstract
We report a measurement of the half-life of the Xe-136 two-neutrino double-beta decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-136-enriched and Xe-136-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of 2.34(-0.46)(+0.80) (stat)(-0.17)(+0.30) (sys) x 10(21) yr is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double-beta-decay searches.
Address
[Novella, P.; Sorel, M.; Uson, A.; Carcel, S.; Carrion, J., V; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Vidal, J. Munoz; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, E-46980 Paterna, Spain, Email: auson@ific.uv.es
Corporate Author
Thesis
Publisher
Amer Physical Soc
Place of Publication
Editor
Language
English
Summary Language
Original Title
Series Editor
Series Title
Abbreviated Series Title
Series Volume
Series Issue
Edition
ISSN
2469-9985
ISBN
Medium
Area
Expedition
Conference
Notes
WOS:000810927800003
Approved
no
Is ISI
yes
International Collaboration
yes
Call Number
IFIC @ pastor @
Serial
5263
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