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Author  |
NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Simon, A.; Sorel, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Yahlali, N. |
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Title |
Measurement of radon-induced backgrounds in the NEXT double beta decay experiment |
Type |
Journal Article |
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Year |
2018 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
10 |
Issue |
10 |
Pages |
112 - 27pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments) |
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Abstract |
The measurement of the internal Rn-222 activity in the NEXT-White detector during the so-called Run-II period with Xe-136-depleted xenon is discussed in detail, together with its implications for double beta decay searches in NEXT. The activity is measured through the alpha production rate induced in the fiducial volume by Rn-222 and its alpha-emitting progeny. The specific activity is measured to be (38.1 +/- 2.2 (stat.) +/- 5.9 (syst.)) mBq/m(3). Radon-induced electrons have also been characterized from the decay of the Bi-214 daughter ions plating out on the cathode of the time projection chamber. From our studies, we conclude that radon-induced backgrounds are sufficiently low to enable a successful NEXT-100 physics program, as the projected rate contribution should not exceed 0.1 counts/yr in the neutrinoless double beta decay sample. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: sorel@ific.uv.es |
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Publisher |
Springer |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Expedition |
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Conference |
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Notes |
WOS:000448191500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3779 |
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