| Records |
| Author |
NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
| Title |
Electron drift and longitudinal diffusion in high pressure xenon-helium gas mixtures |
Type |
Journal Article |
| Year |
2019 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
| Volume |
14 |
Issue |
|
Pages |
P08009 - 19pp |
| Keywords |
Charge transport and multiplication in gas; Gaseous imaging and tracking detectors |
| Abstract |
We report new measurements of the drift velocity and longitudinal diffusion coefficients of electrons in pure xenon gas and in xenon-helium gas mixtures at 1-9 bar and electric field strengths of 50-300 V/cm. In pure xenon we find excellent agreement with world data at all E/P, for both drift velocity and diffusion coefficients. However, a larger value of the longitudinal diffusion coefficient than theoretical predictions is found at low E/P in pure xenon, below the range of reduced fields usually probed by TPC experiments. A similar effect is observed in xenon-helium gas mixtures at somewhat larger E/P. Drift velocities in xenon-helium mixtures are found to be theoretically well predicted. Although longitudinal diffusion in xenon-helium mixtures is found to be larger than anticipated, extrapolation based on the measured longitudinal diffusion coefficients suggest that the use of helium additives to reduce transverse diffusion in xenon gas remains a promising prospect. |
| Address |
[McDonald, A. D.; Woodruff, K.; Al Atoum, B.; Jones, B. J. P.; Laing, A.; Nygren, D. R.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu |
| Corporate Author |
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Thesis |
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| Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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| Language |
English |
Summary Language |
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Original Title |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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ISSN  |
1748-0221 |
ISBN |
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Medium |
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| Area |
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Expedition |
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Conference |
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| Notes |
WOS:000482373600006 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
4118 |
| Permanent link to this record |
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| Author |
NEXT Collaboration (Woodruff, K. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
| Title |
Radio frequency and DC high voltage breakdown of high pressure helium, argon, and xenon |
Type |
Journal Article |
| Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
| Volume |
15 |
Issue |
4 |
Pages |
P04022 - 15pp |
| Keywords |
Gaseous detectors; Gaseous imaging and tracking detectors |
| Abstract |
Motivated by the possibility of guiding daughter ions from double beta decay events to single-ion sensors for barium tagging, the NEXT collaboration is developing a program of R&D to test radio frequency (RF) carpets for ion transport in high pressure xenon gas. This would require carpet functionality in regimes at higher pressures than have been previously reported, implying correspondingly larger electrode voltages than in existing systems. This mode of operation appears plausible for contemporary RF-carpet geometries due to the higher predicted breakdown strength of high pressure xenon relative to low pressure helium, the working medium in most existing RF carpet devices. In this paper we present the first measurements of the high voltage dielectric strength of xenon gas at high pressure and at the relevant RF frequencies for ion transport (in the 10MHz range), as well as new DC and RF measurements of the dielectric strengths of high pressure argon and helium gases at small gap sizes. We find breakdown voltages that are compatible with stable RF carpet operation given the gas, pressure, voltage, materials and geometry of interest. |
| Address |
[Woodruff, K.; Baeza-Rubio, J.; Huerta, D.; Jones, B. J. P.; McDonald, A. D.; Norman, L.; Nygren, D. R.; Byrnes, N. K.; Denisenko, A. A.; Foss, F. W., Jr.; Laing, A.; Martinez, A.; Rogers, L.; Thapa, P.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: katherine.woodruff@uta.edu |
| Corporate Author |
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Thesis |
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| Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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| Language |
English |
Summary Language |
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Original Title |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
1748-0221 |
ISBN |
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Medium |
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| Area |
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Expedition |
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Conference |
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| Notes |
WOS:000534740000022 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
4401 |
| Permanent link to this record |
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| Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
| Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
| Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
| Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
| Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
| Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
| Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
| Corporate Author |
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Thesis |
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| Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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| Language |
English |
Summary Language |
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Original Title |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
1748-0221 |
ISBN |
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Medium |
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| Area |
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Expedition |
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Conference |
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| Notes |
WOS:000595650800024 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
4633 |
| Permanent link to this record |
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| Author |
NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
| Title |
Neutral Bremsstrahlung Emission in Xenon Unveiled |
Type |
Journal Article |
| Year |
2022 |
Publication |
Physical Review X |
Abbreviated Journal |
Phys. Rev. X |
| Volume |
12 |
Issue |
2 |
Pages |
021005 - 23pp |
| Keywords |
|
| Abstract |
We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1). |
| Address |
[Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt; |
| Corporate Author |
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Thesis |
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| Publisher |
Amer Physical Soc |
Place of Publication |
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Editor |
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| Language |
English |
Summary Language |
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Original Title |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
2160-3308 |
ISBN |
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Medium |
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| Area |
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Expedition |
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Conference |
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| Notes |
WOS:000792590100001 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
5220 |
| Permanent link to this record |
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| Author |
NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
| Title |
Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT |
Type |
Journal Article |
| Year |
2022 |
Publication |
Physical Review C |
Abbreviated Journal |
Phys. Rev. C |
| Volume |
105 |
Issue |
5 |
Pages |
055501 - 8pp |
| Keywords |
|
| Abstract |
We report a measurement of the half-life of the Xe-136 two-neutrino double-beta decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-136-enriched and Xe-136-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of 2.34(-0.46)(+0.80) (stat)(-0.17)(+0.30) (sys) x 10(21) yr is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double-beta-decay searches. |
| Address |
[Novella, P.; Sorel, M.; Uson, A.; Carcel, S.; Carrion, J., V; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Vidal, J. Munoz; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, E-46980 Paterna, Spain, Email: auson@ific.uv.es |
| Corporate Author |
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Thesis |
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| Publisher |
Amer Physical Soc |
Place of Publication |
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Editor |
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| Language |
English |
Summary Language |
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Original Title |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
2469-9985 |
ISBN |
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Medium |
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| Area |
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Expedition |
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Conference |
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| Notes |
WOS:000810927800003 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
5263 |
| Permanent link to this record |
