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Author  |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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