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Author NEXT Collaboration (Trindade, A.M.F. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. doi  openurl
  Title Study of the loss of xenon scintillation in xenon-trimethylamine mixtures Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 905 Issue Pages 22-28  
  Keywords Gaseous radiation detectors; Noble gas mixtures; Molecular additives; VUV absorption  
  Abstract (up) This work investigates the capability of TMA ((CH3)(3)N) molecules to shift the wavelength of Xe VUV emission (160-188 nm) to a longer, more manageable, wavelength (260-350 nm). Light emitted from a Xe lamp was passed through a gas chamber filled with Xe-TMA mixtures at 800 Torr and detected with a photomultiplier tube. Using bandpass filters in the proper transmission ranges, no reemitted light was observed experimentally. Considering the detection limit of the experimental system, if reemission by TMA molecules occurs, it is below 0.3% of the scintillation absorbed in the 160-188 nm range. An absorption coefficient value for xenon VUV light by TMA of 0.43 +/- 0.03 cm(-1) Torr(-1) was also obtained. These results can be especially important for experiments considering TMA as a molecular additive to Xe in large volume optical time projection chambers.  
  Address [Trindade, A. M. F.; Escada, J.; Cortez, A. F., V; Borges, F. I. G. M.; Santos, F. P.; Conde, C. A. N.] LIP Lab Instrumentacao & Fis Expt Particulas, Coimbra, Portugal, Email: Kalexandre.trindade@coimbra.lip.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000444425700003 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3730  
Permanent link to this record
 
 
Author Gomez-Cadenas, J.J.; Benlloch-Rodriguez, J.M.; Ferrario, P. doi  openurl
  Title Application of scintillating properties of liquid xenon and silicon photomultiplier technology to medical imaging Type Journal Article
  Year 2016 Publication Spectrochimica Acta Part B Abbreviated Journal Spectroc. Acta Pt. B  
  Volume 118 Issue Pages 6-13  
  Keywords PET; TOF; Liquid xenon; Energy resolution; High sensitivity; Coincidence resolution time (CRT); SiPMs  
  Abstract (up) We describe a new positron emission time-of-flight apparatus using liquid xenon. The detector is based in a liquid xenon scintillating cell. The cell shape and dimensions can be optimized depending on the intended application. In its simplest form, the liquid xenon scintillating cell is a box in which two faces are covered by silicon photomultipliers and the others by a reflecting material such as Teflon. It is a compact, homogenous and highly efficient detector which shares many of the desirable properties of monolithic crystals, with the added advantage of high yield and fast scintillation offered by liquid xenon. Our initial studies suggest that good energy and spatial resolution comparable with that achieved by lutetium oxyorthosilicate crystals can be obtained with a detector based in liquid xenon scintillating cells. In addition, the system can potentially achieve an excellent coincidence resolving time of better than 100 ps.  
  Address [Gomez-Cadenas, J. J.; Benlloch-Rodriguez, J. M.; Ferrario, Paola] Univ Valencia, CSIC, IFIC, E-46003 Valencia, Spain, Email: gomez@mail.cern.ch  
  Corporate Author Thesis  
  Publisher Pergamon-Elsevier Science Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0584-8547 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000374073300002 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ pastor @ Serial 2631  
Permanent link to this record
 
 
Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 877 Issue Pages 157-172  
  Keywords Optical TPCs; Microscopic simulation; Xenon scintillation  
  Abstract (up) We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.  
  Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000415128000022 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3371  
Permanent link to this record
 
 
Author NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Background rejection in NEXT using deep neural networks Type Journal Article
  Year 2017 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 12 Issue Pages T01004 - 21pp  
  Keywords Analysis and statistical methods; Pattern recognition; cluster finding; calibration and fitting methods; Double-beta decay detectors; Time projection chambers  
  Abstract (up) We investigate the potential of using deep learning techniques to reject background events in searches for neutrinoless double beta decay with high pressure xenon time projection chambers capable of detailed track reconstruction. The differences in the topological signatures of background and signal events can be learned by deep neural networks via training over many thousands of events. These networks can then be used to classify further events as signal or background, providing an additional background rejection factor at an acceptable loss of efficiency. The networks trained in this study performed better than previous methods developed based on the use of the same topological signatures by a factor of 1.2 to 1.6, and there is potential for further improvement.  
  Address [Renner, J.; Munoz Vidal, J.; Benlloch-Rodriguez, J. M.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Carrion, J. V.; Cervera, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: jrenner@ific.uv.es  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000395770200004 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2995  
Permanent link to this record
 
 
Author NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Neutral Bremsstrahlung Emission in Xenon Unveiled Type Journal Article
  Year 2022 Publication Physical Review X Abbreviated Journal Phys. Rev. X  
  Volume 12 Issue 2 Pages 021005 - 23pp  
  Keywords  
  Abstract (up) We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1).  
  Address [Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt;  
  Corporate Author Thesis  
  Publisher Amer Physical Soc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2160-3308 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000792590100001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5220  
Permanent link to this record
 
 
Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Electron drift and longitudinal diffusion in high pressure xenon-helium gas mixtures Type Journal Article
  Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 14 Issue Pages P08009 - 19pp  
  Keywords Charge transport and multiplication in gas; Gaseous imaging and tracking detectors  
  Abstract (up) We report new measurements of the drift velocity and longitudinal diffusion coefficients of electrons in pure xenon gas and in xenon-helium gas mixtures at 1-9 bar and electric field strengths of 50-300 V/cm. In pure xenon we find excellent agreement with world data at all E/P, for both drift velocity and diffusion coefficients. However, a larger value of the longitudinal diffusion coefficient than theoretical predictions is found at low E/P in pure xenon, below the range of reduced fields usually probed by TPC experiments. A similar effect is observed in xenon-helium gas mixtures at somewhat larger E/P. Drift velocities in xenon-helium mixtures are found to be theoretically well predicted. Although longitudinal diffusion in xenon-helium mixtures is found to be larger than anticipated, extrapolation based on the measured longitudinal diffusion coefficients suggest that the use of helium additives to reduce transverse diffusion in xenon gas remains a promising prospect.  
  Address [McDonald, A. D.; Woodruff, K.; Al Atoum, B.; Jones, B. J. P.; Laing, A.; Nygren, D. R.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000482373600006 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4118  
Permanent link to this record
 
 
Author NEXT Collaboration (Felkai, R. et al); Sorel, M.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Laing, A.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Rodriguez, J.; Simon, A.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Helium-Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 905 Issue Pages 82-90  
  Keywords Helium; Xenon; Double-beta decay; TPC; Low diffusion; Electroluminescence  
  Abstract (up) Within the framework of xenon-based double beta decay experiments, we propose the possibility to improve the background rejection of an electroluminescent Time Projection Chamber (EL TPC) by reducing the diffusion of the drifting electrons while keeping nearly intact the energy resolution of a pure xenon EL TPC. Based on state-of-the-art microscopic simulations, a substantial addition of helium, around 10 or 15 %, may reduce drastically the transverse diffusion down to 2.5 mm/root m from the 10.5 mm/root m of pure xenon. The longitudinal diffusion remains around 4 mm/root m. Light production studies have been performed as well. They show that the relative variation in energy resolution introduced by such a change does not exceed a few percent, which leaves the energy resolution practically unchanged. The technical caveats of using photomultipliers close to an helium atmosphere are also discussed in detail.  
  Address [Adams, C.; Guenette, R.; Martin-Albo, J.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: francesc.monrabalcapilla@uta.edu  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000444425700010 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3731  
Permanent link to this record
 
 
Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
  Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 773 Issue Pages 663-671  
  Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon  
  Abstract (up) Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.  
  Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000413294200099 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3342  
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