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Berenguer, A.; Coves, A.; Gimeno, B.; Bronchalo, E.; Boria, V.E. Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide 2019 IEEE Microwave and Wireless Components Letters 29 595-597 details   doi
Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.; Alesini, D. Analysis of the Multipactor Effect in an RF Electron Gun Photoinjector 2023 IEEE Transactions on Electron Devices 70 288-295 details   doi
Gonzalez-Iglesias, D.; Gimeno, B.; Esperante, D.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster-Martinez, N.; Blanch, C.; Martinez, E.; Menendez, A.; Fuster, J.; Grudiev, A. Non-resonant ultra-fast multipactor regime in dielectric-assist accelerating structures 2024 Results in Physics 56 107245 - 12pp details   doi
Mata, R.; Cros, A.; Gimeno, B.; Raboso, D. Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods 2024 Journal of Physics D 57 405302 - 9pp details   doi
Monerris-Belda, O.; Cervera Marin, R.; Rodriguez Jodar, M.; Diaz-Caballero, E.; Alcaide Guillen, C.; Petit, J.; Boria, V.E.; Gimeno, B.; Raboso, D. High Power RF Discharge Detection Technique Based on the In-Phase and Quadrature Signals 2021 IEEE Transactions on Microwave Theory and Techniques 69 5429-5438 details   doi
Vague, J.; Melgarejo, J.C.; Boria, V.E.; Guglielmi, M.; Moreno, R.; Reglero, M.; Mata, R.; Montero, I.; Gonzalez-Iglesias, D.; Gimeno, B.; Gomez, A.; Vegas, A.; Raboso, D. Experimental Validation of Multipactor Effect for Ferrite Materials Used in L- and S-Band Nonreciprocal Microwave Components 2019 IEEE Transactions on Microwave Theory and Techniques 67 2151-2161 details   doi
Zhang, X.; Chang, C.; Gimeno, B. Multipactor Analysis in Circular Waveguides Excited by TM01 Mode 2019 IEEE Transactions on Electron Devices 66 4943-4951 details   doi
Zhang, X.; Xiao, Y.T.; Gimeno, B. Multipactor Suppression by a Resonant Static Magnetic Field on a Dielectric Surface 2020 IEEE Transactions on Electron Devices 67 5723-5728 details   doi
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