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Author |
Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.; Alesini, D. |
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Title |
Analysis of the Multipactor Effect in an RF Electron Gun Photoinjector |
Type |
Journal Article |
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Year |
2023 |
Publication |
IEEE Transactions on Electron Devices |
Abbreviated Journal |
IEEE Trans. Electron Devices |
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Volume |
70 |
Issue |
1 |
Pages |
288-295 |
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Keywords |
Magnetic tunneling; Multipactor effect; photoinjector; RF breakdown; RF gun |
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Abstract |
The objective of this work is the evaluation of the risk of suffering a multipactor discharge within an RF electron gun photoinjector. Photoinjectors are a type of source for intense electron beams, which are the main electron source for synchrotron light sources, such as free-electron lasers. The analyzed device consists of 1.6 cells and it has been designed to operate at the S-band. Besides, around the RF gun there is an emittance compensation solenoid, whose magnetic field prevents the growth of the electron beam emittance, and thus the degradation of the properties of the beam. The multipactor analysis is based on a set of numerical simulations by tracking the trajectories of the electron cloud in the cells of the device. To reach this aim, an in-house multipactor code was developed. Specifically, two different cases were explored: with the emittance compensation solenoid assumed to be off and with the emittance compensation solenoid in operation. For both the cases, multipactor simulations were carried out exploring different RF electric field amplitudes. Moreover, for a better understanding of the multipactor phenomenon, the resonant trajectories of the electrons and the growth rate of the electrons population are investigated. |
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Address |
[Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.] Univ Valencia, Inst Fis Corpuscular IFIC, CSIC, Paterna 46980, Spain, Email: Daniel.Gonzalez-Iglesias@uv.es |
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Publisher |
Ieee-Inst Electrical Electronics Engineers Inc |
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Language |
English |
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Original Title |
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Edition |
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ISSN |
0018-9383 |
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Notes |
WOS:000890813600001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
no |
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Call Number |
IFIC @ pastor @ |
Serial |
5427 |
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Permanent link to this record |