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Author |
NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging |
Type |
Journal Article |
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Year |
2018 |
Publication |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume  |
120 |
Issue |
13 |
Pages |
132504 - 6pp |
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Abstract |
A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers. |
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Address |
[McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu; |
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Amer Physical Soc |
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English |
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ISSN |
0031-9007 |
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Conference |
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Notes |
WOS:000428243400005 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3538 |
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Author |
NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT |
Type |
Journal Article |
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Year |
2022 |
Publication |
Physical Review C |
Abbreviated Journal |
Phys. Rev. C |
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Volume |
105 |
Issue |
5 |
Pages |
055501 - 8pp |
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Keywords |
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Abstract |
We report a measurement of the half-life of the Xe-136 two-neutrino double-beta decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-136-enriched and Xe-136-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of 2.34(-0.46)(+0.80) (stat)(-0.17)(+0.30) (sys) x 10(21) yr is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double-beta-decay searches. |
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Address |
[Novella, P.; Sorel, M.; Uson, A.; Carcel, S.; Carrion, J., V; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Vidal, J. Munoz; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, E-46980 Paterna, Spain, Email: auson@ific.uv.es |
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Amer Physical Soc |
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English |
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Edition |
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ISSN |
2469-9985 |
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Conference |
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Notes |
WOS:000810927800003 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
5263 |
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Author |
NEXT Collaboration; Carcel, S.; Carrion, J.V.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Mitigation of backgrounds from cosmogenic Xe-137 in xenon gas experiments using He-3 neutron capture |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Physics G |
Abbreviated Journal |
J. Phys. G |
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Volume |
47 |
Issue |
7 |
Pages |
075001 - 17pp |
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Keywords |
gaseous detectors; scintillators; scintillation and light emission processes; solid; gas and liquid scintillators |
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Abstract |
Xe-136 is used as the target medium for many experiments searching for 0 nu beta beta. Despite underground operation, cosmic muons that reach the laboratory can produce spallation neutrons causing activation of detector materials. A potential background that is difficult to veto using muon tagging comes in the form of Xe-137 created by the capture of neutrons on Xe-136. This isotope decays via beta decay with a half-life of 3.8 min and a Q(beta) of similar to 4.16 MeV. This work proposes and explores the concept of adding a small percentage of He-3 to xenon as a means to capture thermal neutrons and reduce the number of activations in the detector volume. When using this technique we find the contamination from Xe-137 activation can be reduced to negligible levels in tonne and multi-tonne scale high pressure gas xenon neutrinoless double beta decay experiments running at any depth in an underground laboratory. |
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Address |
[Rogers, L.; Jones, B. J. P.; Laing, A.; Pingulkar, S.; Smithers, B.; Woodruff, K.; Byrnes, N.; Dingler, R.; McDonald, A. D.; Nygren, D. R.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: leslie.rogers@mavs.uta.edu |
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Publisher |
Iop Publishing Ltd |
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English |
Summary Language |
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Original Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0954-3899 |
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Conference |
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Notes |
WOS:000537753800001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4423 |
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Author |
NEXT Collaboration (Woodruff, K. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Radio frequency and DC high voltage breakdown of high pressure helium, argon, and xenon |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
4 |
Pages |
P04022 - 15pp |
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Keywords |
Gaseous detectors; Gaseous imaging and tracking detectors |
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Abstract |
Motivated by the possibility of guiding daughter ions from double beta decay events to single-ion sensors for barium tagging, the NEXT collaboration is developing a program of R&D to test radio frequency (RF) carpets for ion transport in high pressure xenon gas. This would require carpet functionality in regimes at higher pressures than have been previously reported, implying correspondingly larger electrode voltages than in existing systems. This mode of operation appears plausible for contemporary RF-carpet geometries due to the higher predicted breakdown strength of high pressure xenon relative to low pressure helium, the working medium in most existing RF carpet devices. In this paper we present the first measurements of the high voltage dielectric strength of xenon gas at high pressure and at the relevant RF frequencies for ion transport (in the 10MHz range), as well as new DC and RF measurements of the dielectric strengths of high pressure argon and helium gases at small gap sizes. We find breakdown voltages that are compatible with stable RF carpet operation given the gas, pressure, voltage, materials and geometry of interest. |
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Address |
[Woodruff, K.; Baeza-Rubio, J.; Huerta, D.; Jones, B. J. P.; McDonald, A. D.; Norman, L.; Nygren, D. R.; Byrnes, N. K.; Denisenko, A. A.; Foss, F. W., Jr.; Laing, A.; Martinez, A.; Rogers, L.; Thapa, P.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: katherine.woodruff@uta.edu |
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Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Conference |
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Notes |
WOS:000534740000022 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4401 |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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