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Author NEXT Collaboration (Renner, J. et al); Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Luque, C.; Simon, A.; Sorel, M.; Yahlali, N.
Title (up) Initial results on energy resolution of the NEXT-White detector Type Journal Article
Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 13 Issue Pages P10020 - 14pp
Keywords Large detector-systems performance; Analysis and statistical methods; Double-beta decay detectors; Time projection chambers
Abstract One of the major goals of the NEXT-White (NEW) detector is to demonstrate the energy resolution that an electroluminescent high pressure xenon TPC can achieve for high energy tracks. For this purpose, energy calibrations with Cs-137 and Th-232 sources have been carried out as a part of the long run taken with the detector during most of 2017. This paper describes the initial results obtained with those calibrations, showing excellent linearity and an energy resolution that extrapolates to approximately 1% FWHM at Q(beta beta).
Address [Adams, C.; Guenette, R.; Martin-Albo, J.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: josren@uv.es
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000447691000004 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3775
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Author NEXT Collaboration (Fernandes, A.F.M. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title (up) Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield Type Journal Article
Year 2020 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 04 Issue 4 Pages 034 - 18pp
Keywords Particle correlations and fluctuations; Photon production; Dark Matter and Double Beta Decay (experiments); Rare decay
Abstract High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: cristinam@uc.pt
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000525257400001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4366
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Author NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Simon, A.; Sorel, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Yahlali, N.
Title (up) Measurement of radon-induced backgrounds in the NEXT double beta decay experiment Type Journal Article
Year 2018 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 10 Issue 10 Pages 112 - 27pp
Keywords Dark Matter and Double Beta Decay (experiments)
Abstract The measurement of the internal Rn-222 activity in the NEXT-White detector during the so-called Run-II period with Xe-136-depleted xenon is discussed in detail, together with its implications for double beta decay searches in NEXT. The activity is measured through the alpha production rate induced in the fiducial volume by Rn-222 and its alpha-emitting progeny. The specific activity is measured to be (38.1 +/- 2.2 (stat.) +/- 5.9 (syst.)) mBq/m(3). Radon-induced electrons have also been characterized from the decay of the Bi-214 daughter ions plating out on the cathode of the time projection chamber. From our studies, we conclude that radon-induced backgrounds are sufficiently low to enable a successful NEXT-100 physics program, as the projected rate contribution should not exceed 0.1 counts/yr in the neutrinoless double beta decay sample.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: sorel@ific.uv.es
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000448191500001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3779
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Author NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title (up) Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT Type Journal Article
Year 2022 Publication Physical Review C Abbreviated Journal Phys. Rev. C
Volume 105 Issue 5 Pages 055501 - 8pp
Keywords
Abstract We report a measurement of the half-life of the Xe-136 two-neutrino double-beta decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-136-enriched and Xe-136-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of 2.34(-0.46)(+0.80) (stat)(-0.17)(+0.30) (sys) x 10(21) yr is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double-beta-decay searches.
Address [Novella, P.; Sorel, M.; Uson, A.; Carcel, S.; Carrion, J., V; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Vidal, J. Munoz; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, E-46980 Paterna, Spain, Email: auson@ific.uv.es
Corporate Author Thesis
Publisher Amer Physical Soc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 2469-9985 ISBN Medium
Area Expedition Conference
Notes WOS:000810927800003 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 5263
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Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.
Title (up) Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 877 Issue Pages 157-172
Keywords Optical TPCs; Microscopic simulation; Xenon scintillation
Abstract We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.
Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000415128000022 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3371
Permanent link to this record