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Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N. |
An improved measurement of electron-ion recombination in high-pressure xenon gas |
2015 |
Journal of Instrumentation |
10 |
P03025 - 21pp |
|
|
|
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |
|
|
|
NEXT Collaboration (Martinez-Lema, G. et al); Palmeiro, B.; Botas, A.; Laing, A.; Renner, J.; Simon, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Lugue, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
Calibration of the NEXT-White detector using Kr-83m decays |
2018 |
Journal of Instrumentation |
13 |
P10014 - 21pp |
|
|
|
NEXT Collaboration (Lorca, D. et al); Martin-Albo, J.; Laing, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Characterisation of NEXT-DEMO using xenon K-alpha X-rays |
2014 |
Journal of Instrumentation |
9 |
P10007 - 20pp |
|
|
|
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
2020 |
Journal of Instrumentation |
15 |
P11031 - 16pp |
|
