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Author |
BABAR Collaboration (del Amo Sanchez, P. et al); Lopez-March, N.; Martinez-Vidal, F.; Milanes, D.A.; Oyanguren, A. |
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Title |
Search for the rare decay B -> Kv(v)over-bar |
Type |
Journal Article |
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Year |
2010 |
Publication |
Physical Review D |
Abbreviated Journal |
Phys. Rev. D |
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Volume |
82 |
Issue  |
11 |
Pages |
112002 - 10pp |
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Keywords |
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Abstract |
We present a search for the rare decays B+ -> K+ v (v) over bar and B-0 -> K-0 v (v) over bar using 459 x 10(6) B (B) over bar pairs collected with the BABAR detector at the SLAC National Accelerator Laboratory. Flavor-changing neutral-current decays such as these are forbidden at tree level but can occur through one-loop diagrams in the standard model (SM), with possible contributions from new physics at the same order. The presence of two neutrinos in the final state makes identification of signal events challenging, so reconstruction in the semileptonic decay channels B -> D-(*) lv of the B meson recoiling from the signal B is used to suppress backgrounds. We set an upper limit at the 90% confidence level (CL) of 1.3 x 10(-5) on the total branching fraction for B+ -> K+ v (v) over bar, and 5.6 x 10(-5) for B-0 -> K-0 v (v) over bar. We additionally report 90% CL upper limits on partial branching fractions in two ranges of dineutrino mass squared for B+ -> K+ v (v) over bar. |
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Address |
[Sanchez, P. del Amo; Lees, J. P.; Poireau, V.; Prencipe, E.; Tisserand, V.] Univ Savoie, CNRS, IN2P3, LAPP, F-74941 Annecy Le Vieux, France |
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Amer Physical Soc |
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English |
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ISSN |
1550-7998 |
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Notes |
ISI:000286566100001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
523 |
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Author |
BABAR Collaboration (Lees, J.P. et al); Lopez-March, N.; Martinez-Vidal, F.; Oyanguren, A. |
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Title |
Amplitude analysis of B0 -> K+ pi- pi0 and evidence of direct CP violation in B -> K * pi decays |
Type |
Journal Article |
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Year |
2011 |
Publication |
Physical Review D |
Abbreviated Journal |
Phys. Rev. D |
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Volume |
83 |
Issue |
11 |
Pages |
112010 - 21pp |
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Keywords |
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Abstract |
We analyze the decay B-0 -> K+ pi(-) pi(0) with a sample of 4.54 x 10(8) B (B) over bar events collected by the BABAR detector at the PEP-II asymmetric-energy B factory at SLAC, and extract the complex amplitudes of seven interfering resonances over the Dalitz plot. These results are combined with amplitudes measured in B-0 -> K-S(0)pi(+)pi(-) decays to construct isospin amplitudes from B-0 -> K* pi and B-0 -> rho K decays. We measure the phase of the isospin amplitude Phi(3/2), useful in constraining the Cabibbo-Kobayashi-Maskawa unitarity triangle angle gamma and evaluate a CP rate asymmetry sum rule sensitive to the presence of new physics operators. We measure direct CP violation in B-0 -> K*(+) pi(-) decays at the level of 3 sigma when measurements from both B-0 -> K+ pi(-) pi(0) and B-0 -> K-S(0) pi(+) pi(-) decays are combined. |
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Address |
[Lees, J. P.; Poireau, V.; Prencipe, E.; Tisserand, V.] Univ Savoie, CNRS IN2P3, Lab Annecy Le Vieux Phys Particules LAPP, F-74941 Annecy Le Vieux, France |
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Publisher |
Amer Physical Soc |
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English |
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ISSN |
1550-7998 |
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Notes |
ISI:000292240300001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ elepoucu @ |
Serial |
661 |
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Author |
Bevan, A.J. et al; Martinez-Vidal, F.; Pich, A.; Azzolini, V.; Bernabeu, J.; Lopez-March, N.; Milanes, D.A.; Oyanguren, A.; Villanueva-Perez, P. |
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Title |
The Physics of the B Factories |
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Journal Article |
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Year |
2014 |
Publication |
European Physical Journal C |
Abbreviated Journal |
Eur. Phys. J. C |
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Volume |
74 |
Issue |
11 |
Pages |
3026 - 916pp |
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Address |
[Bevan, A. J.; Azzopardi, D. E.; Bellodi, G.; Clarke, C. K.; Cormack, C. M.; Dixon, P.; George, K. A.; Di Lodovico, F.; Menges, W.; Newman-Coburn, D.; Potter, R. J. L.; Sacco, R.; Shorthouse, H. W.; Sigamani, M.; Strother, P.; Vidal, P. B.; Williams, M. I.] Univ London, London E1 4NS, England |
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Publisher |
Springer |
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English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1434-6044 |
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Conference |
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Notes |
WOS:000347169500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
2074 |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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Author |
NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Simon, A.; Sorel, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Yahlali, N. |
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Title |
Measurement of radon-induced backgrounds in the NEXT double beta decay experiment |
Type |
Journal Article |
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Year |
2018 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
10 |
Issue |
10 |
Pages |
112 - 27pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments) |
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Abstract |
The measurement of the internal Rn-222 activity in the NEXT-White detector during the so-called Run-II period with Xe-136-depleted xenon is discussed in detail, together with its implications for double beta decay searches in NEXT. The activity is measured through the alpha production rate induced in the fiducial volume by Rn-222 and its alpha-emitting progeny. The specific activity is measured to be (38.1 +/- 2.2 (stat.) +/- 5.9 (syst.)) mBq/m(3). Radon-induced electrons have also been characterized from the decay of the Bi-214 daughter ions plating out on the cathode of the time projection chamber. From our studies, we conclude that radon-induced backgrounds are sufficiently low to enable a successful NEXT-100 physics program, as the projected rate contribution should not exceed 0.1 counts/yr in the neutrinoless double beta decay sample. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: sorel@ific.uv.es |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000448191500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3779 |
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