| |
Records |
Links |
|
Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
|
| |
Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
| |
Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
|
| |
Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
|
| |
Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
|
| |
Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
|
| |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
|
| |
Corporate Author |
|
Thesis |
|
|
| |
Publisher |
Iop Publishing Ltd |
Place of Publication |
|
Editor |
|
|
| |
Language |
English |
Summary Language |
|
Original Title |
|
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN  |
1748-0221 |
ISBN |
|
Medium |
|
|
| |
Area |
|
Expedition |
|
Conference |
|
|
| |
Notes |
WOS:000595650800024 |
Approved |
no |
|
| |
Is ISI |
yes |
International Collaboration |
yes |
|
| |
Call Number |
IFIC @ pastor @ |
Serial |
4633 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
|
| |
Title |
Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness |
Type |
Journal Article |
| |
Year |
2023 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
|
| |
Volume |
18 |
Issue |
3 |
Pages |
P03016 - 21pp |
|
| |
Keywords |
Materials for gaseous detectors; Particle tracking detectors (Gaseous detectors); Time projection chambers |
|
| |
Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal. |
|
| |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA, Email: adam.fahs@mail.utoronto.ca |
|
| |
Corporate Author |
|
Thesis |
|
|
| |
Publisher |
IOP Publishing Ltd |
Place of Publication |
|
Editor |
|
|
| |
Language |
English |
Summary Language |
|
Original Title |
|
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
1748-0221 |
ISBN |
|
Medium |
|
|
| |
Area |
|
Expedition |
|
Conference |
|
|
| |
Notes |
WOS:000971136300003 |
Approved |
no |
|
| |
Is ISI |
yes |
International Collaboration |
yes |
|
| |
Call Number |
IFIC @ pastor @ |
Serial |
5526 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
|
| |
Title |
Neutral Bremsstrahlung Emission in Xenon Unveiled |
Type |
Journal Article |
| |
Year |
2022 |
Publication |
Physical Review X |
Abbreviated Journal |
Phys. Rev. X |
|
| |
Volume |
12 |
Issue |
2 |
Pages |
021005 - 23pp |
|
| |
Keywords |
|
|
| |
Abstract |
We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1). |
|
| |
Address |
[Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt; |
|
| |
Corporate Author |
|
Thesis |
|
|
| |
Publisher |
Amer Physical Soc |
Place of Publication |
|
Editor |
|
|
| |
Language |
English |
Summary Language |
|
Original Title |
|
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
2160-3308 |
ISBN |
|
Medium |
|
|
| |
Area |
|
Expedition |
|
Conference |
|
|
| |
Notes |
WOS:000792590100001 |
Approved |
no |
|
| |
Is ISI |
yes |
International Collaboration |
yes |
|
| |
Call Number |
IFIC @ pastor @ |
Serial |
5220 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
NEXT Collaboration (Novella, P. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
|
| |
Title |
Measurement of the Xe-136 two-neutrino double-beta-decay half-life via direct background subtraction in NEXT |
Type |
Journal Article |
| |
Year |
2022 |
Publication |
Physical Review C |
Abbreviated Journal |
Phys. Rev. C |
|
| |
Volume |
105 |
Issue |
5 |
Pages |
055501 - 8pp |
|
| |
Keywords |
|
|
| |
Abstract |
We report a measurement of the half-life of the Xe-136 two-neutrino double-beta decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-136-enriched and Xe-136-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of 2.34(-0.46)(+0.80) (stat)(-0.17)(+0.30) (sys) x 10(21) yr is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double-beta-decay searches. |
|
| |
Address |
[Novella, P.; Sorel, M.; Uson, A.; Carcel, S.; Carrion, J., V; Diaz, J.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Vidal, J. Munoz; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, E-46980 Paterna, Spain, Email: auson@ific.uv.es |
|
| |
Corporate Author |
|
Thesis |
|
|
| |
Publisher |
Amer Physical Soc |
Place of Publication |
|
Editor |
|
|
| |
Language |
English |
Summary Language |
|
Original Title |
|
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
2469-9985 |
ISBN |
|
Medium |
|
|
| |
Area |
|
Expedition |
|
Conference |
|
|
| |
Notes |
WOS:000810927800003 |
Approved |
no |
|
| |
Is ISI |
yes |
International Collaboration |
yes |
|
| |
Call Number |
IFIC @ pastor @ |
Serial |
5263 |
|
| Permanent link to this record |
