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Author Berenguer, A.; Coves, A.; Gimeno, B.; Bronchalo, E.; Boria, V.E. doi  openurl
  Title Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide Type Journal Article
  Year 2019 Publication IEEE Microwave and Wireless Components Letters Abbreviated Journal IEEE Microw. Wirel. Compon. Lett.  
  Volume 29 Issue 9 Pages 595-597  
  Keywords Dielectric; multipactor effect; rectangular waveguide; RF breakdown; Secondary Electron Yield (SEY); waveguide transformer  
  Abstract (down) This letter presents the experimental study of the multipactor threshold in a partially dielectric-loaded rectangular waveguide, whose results validate a multipactor model recently developed by the authors, which includes the charge distribution appearing on the dielectric surface during the multipactor discharge. First, the variation of the multipactor RF voltage threshold has been theoretically analyzed in different waveguide configurations: in an empty waveguide, and also in the cases of a one-sided and two-sided dielectric-loaded waveguides. To reach this aim, an in-house Monte Carlo simulation tool has been developed. The Secondary Electron Yield (SEY) of the metallic and dielectric materials used in the numerical simulations have been measured experimentally. Finally, an aluminum WR-75 symmetric E-plane rectangular waveguide transformer has been designed and fabricated, in which several multipaction tests have been carried out to validate the in-house software tool, demonstrating an excellent agreement between the simulation results and the experimental data.  
  Address [Berenguer, Andres; Coves, Angela; Bronchalo, Enrique] Univ Miguel Hernandez Elche, Dept Commun Engn, Elche 03202, Spain, Email: angela.coves@umh.es  
  Corporate Author Thesis  
  Publisher Ieee-Inst Electrical Electronics Engineers Inc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1531-1309 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000489754400009 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ pastor @ Serial 4170  
Permanent link to this record
 

 
Author Mata, R.; Cros, A.; Gimeno, B.; Raboso, D. doi  openurl
  Title Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods Type Journal Article
  Year 2024 Publication Journal of Physics D Abbreviated Journal J. Phys. D  
  Volume 57 Issue 40 Pages 405302 - 9pp  
  Keywords dielectrics; secondary electron emission yield; Multipactor in space devices  
  Abstract (down) The recent high demand of secondary electron emission yield (SEY) measurements in dielectric materials from space industry has driven SEY laboratories to improve their facilities and measurement techniques. SEY determination by the common capacitive method, also known as pulsed method, is well accepted and has given satisfactory results in most cases. Nevertheless, the samples under study must be prepared according to the experimental limitations of the technique, i.e. they should be manufactured separated from the devices representing faithfully the surface state of the own device and be as thin as possible. A method based on the Kelvin probe (KP) is proposed here to obtain the SEY characteristics of electrically floating Platinum, Kapton and Teflon placed over dielectric spacers with thicknesses ranging from 1.6 to 12.1 mm. The results are compared with those of the capacitive method and indicate that KP SEY curves are less sensitive to spacer thickness. An explanation based on the literature is also given. In all, we have established that KP is better suited for the analysis of dielectric samples thicker than 3 mm.  
  Address [Mata, R.; Gimeno, B.] Ciudad Politecn Innovac, Val Space Consortium, Edificio 8G,Acceso B,Planta B, Valencia 46022, Spain, Email: rafael.mata@uv.es  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0022-3727 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001269188200001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 6203  
Permanent link to this record
 

 
Author Menendez, A.; Esperante, D.; Garcia-Olcina, R.; Torres, J.; Perez-Soler, J.; Marco, R.; Gimeno, B.; Martos, J.; Soret, J. doi  openurl
  Title RF Acquisition System Based on μTCA for Testing of High-Gradient Acceleration Cavities Type Journal Article
  Year 2022 Publication Electronics Abbreviated Journal Electronics  
  Volume 11 Issue 5 Pages 720 - 22pp  
  Keywords radio frequency; accelerator cavities; mu TCA systems; Low Level RF system  
  Abstract (down) The radio frequency (RF) laboratory hosted in the Corpuscular Physics Institute (IFIC) of the University of Valencia is designed to house a high-power and high-repetition-rate facility to test normal conduction RF accelerator cavities in the S-Band (2.9985 GHz) in order to perform R & D activities related to particle accelerator cavities. The system, which manages the entire process of RF signal generation, data acquisition and closed-loop control of the laboratory, is currently based on a modular and compact PXI platform system. This contribution details the development of a platform with similar features, but which is based on open architecture standards at both the hardware and software level. For this purpose, a complete system based on the μTCA platform has been developed. This new system must be able to work with accelerator cavities at other operating frequencies, such as 750 MHz, as well as to explore different options at firmware and software levels based on open-source codes.  
  Address [Menendez, Abraham; Esperante, Daniel; Marco, Ricardo; Gimeno, Benito] Univ Valencia, Inst Fis Corpuscular IF, CSIC, Paterna, Spain, Email: daniel.esperante@uv.es;  
  Corporate Author Thesis  
  Publisher Mdpi Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000772931900001 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ pastor @ Serial 5189  
Permanent link to this record
 

 
Author Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.; Alesini, D. doi  openurl
  Title Analysis of the Multipactor Effect in an RF Electron Gun Photoinjector Type Journal Article
  Year 2023 Publication IEEE Transactions on Electron Devices Abbreviated Journal IEEE Trans. Electron Devices  
  Volume 70 Issue 1 Pages 288-295  
  Keywords Magnetic tunneling; Multipactor effect; photoinjector; RF breakdown; RF gun  
  Abstract (down) The objective of this work is the evaluation of the risk of suffering a multipactor discharge within an RF electron gun photoinjector. Photoinjectors are a type of source for intense electron beams, which are the main electron source for synchrotron light sources, such as free-electron lasers. The analyzed device consists of 1.6 cells and it has been designed to operate at the S-band. Besides, around the RF gun there is an emittance compensation solenoid, whose magnetic field prevents the growth of the electron beam emittance, and thus the degradation of the properties of the beam. The multipactor analysis is based on a set of numerical simulations by tracking the trajectories of the electron cloud in the cells of the device. To reach this aim, an in-house multipactor code was developed. Specifically, two different cases were explored: with the emittance compensation solenoid assumed to be off and with the emittance compensation solenoid in operation. For both the cases, multipactor simulations were carried out exploring different RF electric field amplitudes. Moreover, for a better understanding of the multipactor phenomenon, the resonant trajectories of the electrons and the growth rate of the electrons population are investigated.  
  Address [Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.] Univ Valencia, Inst Fis Corpuscular IFIC, CSIC, Paterna 46980, Spain, Email: Daniel.Gonzalez-Iglesias@uv.es  
  Corporate Author Thesis  
  Publisher Ieee-Inst Electrical Electronics Engineers Inc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0018-9383 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000890813600001 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ pastor @ Serial 5427  
Permanent link to this record
 

 
Author Gonzalez-Iglesias, D.; Gimeno, B.; Esperante, D.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster-Martinez, N.; Blanch, C.; Martinez, E.; Menendez, A.; Fuster, J.; Grudiev, A. url  doi
openurl 
  Title Non-resonant ultra-fast multipactor regime in dielectric-assist accelerating structures Type Journal Article
  Year 2024 Publication Results in Physics Abbreviated Journal Results Phys.  
  Volume 56 Issue Pages 107245 - 12pp  
  Keywords Multipactor; Dielectric accelerating structures; RF particle accelerators; Plasma discharge  
  Abstract (down) The objective of this work is the evaluation of the risk of suffering a multipactor discharge in an S-band dielectric-assist accelerating (DAA) structure for a compact low-energy linear particle accelerator dedicated to hadrontherapy treatments. A DAA structure consists of ultra-low loss dielectric cylinders and disks with irises which are periodically arranged in a metallic enclosure, with the advantage of having an extremely high quality factor and very high shunt impedance at room temperature, and it is therefore proposed as a potential alternative to conventional disk-loaded copper structures. However, it has been observed that these structures suffer from multipactor discharges. In fact, multipactor is one of the main problems of these devices, as it limits the maximum accelerating gradient. Because of this, the analysis of multipactor risk in the early design steps of DAA cavities is crucial to ensure the correct performance of the device after fabrication. In this paper, we present a comprehensive and detailed study of multipactor in our DAA design through numerical simulations performed with an in-house developed code based on the Monte-Carlo method. The phenomenology of the multipactor (resonant electron trajectories, electron flight time between impacts, etc.) is described in detail for different values of the accelerating gradient. It has been found that in these structures an ultra-fast non-resonant multipactor appears, which is different from the types of multipactor theoretically studied in the scientific literature. In addition, the effect of several low electron emission coatings on the multipactor threshold is investigated. Furthermore, a novel design based on the modification of the DAA cell geometry for multipactor mitigation is introduced, which shows a significant increase in the accelerating gradient handling capabilities of our prototype.  
  Address [Gonzalez-Iglesias, Daniel; Gimeno, Benito; Esperante, Daniel; Martinez-Reviriego, Pablo; Martin-Luna, Pablo; Fuster-Martinez, Nuria; Blanch, Cesar; Martinez, Eduardo; Menendez, Abraham; Fuster, Juan] CSIC UV, Inst Fis Corpuscular IF, c Catedrat Jose Beltran 2, Paterna 46980, Spain, Email: daniel.gonzalez-iglesias@uv.es  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2211-3797 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001133850600001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5866  
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