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Author NEXT Collaboration (Trindade, A.M.F. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. doi  openurl
  Title Study of the loss of xenon scintillation in xenon-trimethylamine mixtures Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 905 Issue Pages 22-28  
  Keywords Gaseous radiation detectors; Noble gas mixtures; Molecular additives; VUV absorption  
  Abstract (up) This work investigates the capability of TMA ((CH3)(3)N) molecules to shift the wavelength of Xe VUV emission (160-188 nm) to a longer, more manageable, wavelength (260-350 nm). Light emitted from a Xe lamp was passed through a gas chamber filled with Xe-TMA mixtures at 800 Torr and detected with a photomultiplier tube. Using bandpass filters in the proper transmission ranges, no reemitted light was observed experimentally. Considering the detection limit of the experimental system, if reemission by TMA molecules occurs, it is below 0.3% of the scintillation absorbed in the 160-188 nm range. An absorption coefficient value for xenon VUV light by TMA of 0.43 +/- 0.03 cm(-1) Torr(-1) was also obtained. These results can be especially important for experiments considering TMA as a molecular additive to Xe in large volume optical time projection chambers.  
  Address [Trindade, A. M. F.; Escada, J.; Cortez, A. F., V; Borges, F. I. G. M.; Santos, F. P.; Conde, C. A. N.] LIP Lab Instrumentacao & Fis Expt Particulas, Coimbra, Portugal, Email: Kalexandre.trindade@coimbra.lip.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000444425700003 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3730  
Permanent link to this record
 

 
Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 877 Issue Pages 157-172  
  Keywords Optical TPCs; Microscopic simulation; Xenon scintillation  
  Abstract (up) We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.  
  Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000415128000022 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3371  
Permanent link to this record
 

 
Author NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Background rejection in NEXT using deep neural networks Type Journal Article
  Year 2017 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 12 Issue Pages T01004 - 21pp  
  Keywords Analysis and statistical methods; Pattern recognition; cluster finding; calibration and fitting methods; Double-beta decay detectors; Time projection chambers  
  Abstract (up) We investigate the potential of using deep learning techniques to reject background events in searches for neutrinoless double beta decay with high pressure xenon time projection chambers capable of detailed track reconstruction. The differences in the topological signatures of background and signal events can be learned by deep neural networks via training over many thousands of events. These networks can then be used to classify further events as signal or background, providing an additional background rejection factor at an acceptable loss of efficiency. The networks trained in this study performed better than previous methods developed based on the use of the same topological signatures by a factor of 1.2 to 1.6, and there is potential for further improvement.  
  Address [Renner, J.; Munoz Vidal, J.; Benlloch-Rodriguez, J. M.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Carrion, J. V.; Cervera, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: jrenner@ific.uv.es  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000395770200004 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2995  
Permanent link to this record
 

 
Author NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Near-intrinsic energy resolution for 30-662 keV gamma rays in a high pressure xenon electroluminescent TPC Type Journal Article
  Year 2013 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 708 Issue Pages 101-114  
  Keywords Xenon; Energy resolution; High-pressure; TPC; Electroluminescence; Neutrinoless double beta decay  
  Abstract (up) We present the design, data and results from the NEXT prototype for Double Beta and Dark Matter (NEXT-DBDM) detector, a high-pressure gaseous natural xenon electroluminescent time projection chamber (TPC) that was built at the Lawrence Berkeley National Laboratory. It is a prototype of the planned NEXT-100 Xe-136 neutrino-less double beta decay (0 nu beta beta) experiment with the main objectives of demonstrating near-intrinsic energy resolution at energies up to 662 keV and of optimizing the NEXT-100 detector design and operating parameters. Energy resolutions of similar to 1% FWHM for 662 keV gamma rays were obtained at 10 and 15 atm and similar to 5% FWHM for 30 keV fluorescence xenon X-rays. These results demonstrate that 0.5% FWHM resolutions for the 2459 keV hypothetical neutrino-less double beta decay peak are realizable. This energy resolution is a factor 7-20 better than that of the current leading 0 nu beta beta experiments using liquid xenon and thus represents a significant advancement. We present also first results from a track imaging system consisting of 64 silicon photo-multipliers recently installed in NEXT-DBDM that, along with the excellent energy resolution, demonstrates the key functionalities required for the NEXT-100 0 nu beta beta search.  
  Address [Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J. J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Munoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Valencia 46980, Spain, Email: agoldschmidt@lbl.gov  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000316192300015 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 1369  
Permanent link to this record
 

 
Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Electron drift and longitudinal diffusion in high pressure xenon-helium gas mixtures Type Journal Article
  Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 14 Issue Pages P08009 - 19pp  
  Keywords Charge transport and multiplication in gas; Gaseous imaging and tracking detectors  
  Abstract (up) We report new measurements of the drift velocity and longitudinal diffusion coefficients of electrons in pure xenon gas and in xenon-helium gas mixtures at 1-9 bar and electric field strengths of 50-300 V/cm. In pure xenon we find excellent agreement with world data at all E/P, for both drift velocity and diffusion coefficients. However, a larger value of the longitudinal diffusion coefficient than theoretical predictions is found at low E/P in pure xenon, below the range of reduced fields usually probed by TPC experiments. A similar effect is observed in xenon-helium gas mixtures at somewhat larger E/P. Drift velocities in xenon-helium mixtures are found to be theoretically well predicted. Although longitudinal diffusion in xenon-helium mixtures is found to be larger than anticipated, extrapolation based on the measured longitudinal diffusion coefficients suggest that the use of helium additives to reduce transverse diffusion in xenon gas remains a promising prospect.  
  Address [McDonald, A. D.; Woodruff, K.; Al Atoum, B.; Jones, B. J. P.; Laing, A.; Nygren, D. R.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000482373600006 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4118  
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