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Author |
Domingo-Pardo, C.; Goel, N.; Engert, T.; Gerl, J.; Kojouharov, I.; Schaffner, H.; Didierjean, F.; Duchene, G.; Sigward, M.H. |
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Title |
A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors |
Type |
Journal Article |
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Year |
2011 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
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Volume |
643 |
Issue |
1 |
Pages |
79-88 |
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Keywords |
gamma-detector; Pulse shape analysis; Tracking; Semiconductor |
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Abstract |
A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors. |
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Address |
[Domingo-Pardo, C; Goel, N; Engert, T; Gerl, J; Kojouharov, I; Schaffner, H] GSI Helmholtzzentnim Schwenonenforsch mbH, D-64291 Darmstadt, Germany, Email: cesar.domingo@ific.uv.es |
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Publisher |
Elsevier Science Bv |
Place of Publication |
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Language |
English |
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Original Title |
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Edition |
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ISSN |
0168-9002 |
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Notes |
WOS:000292442700014 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
694 |
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Permanent link to this record |