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Author (up) Domingo-Pardo, C.; Goel, N.; Engert, T.; Gerl, J.; Kojouharov, I.; Schaffner, H.; Didierjean, F.; Duchene, G.; Sigward, M.H. doi  openurl
  Title A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors Type Journal Article
  Year 2011 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 643 Issue 1 Pages 79-88  
  Keywords gamma-detector; Pulse shape analysis; Tracking; Semiconductor  
  Abstract A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.  
  Address [Domingo-Pardo, C; Goel, N; Engert, T; Gerl, J; Kojouharov, I; Schaffner, H] GSI Helmholtzzentnim Schwenonenforsch mbH, D-64291 Darmstadt, Germany, Email: cesar.domingo@ific.uv.es  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000292442700014 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 694  
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