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Contreras, T.; Martins, A.; Stanford, C.; Escobar, C.O.; Guenette, R.; Stancari, M.; Martin-Albo, J.; Lawrence-Sanderson, B.; Para, A.; Kish, A.; Kellerer, F. |
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Title |
A method to characterize metalenses for light collection applications |
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Journal Article |
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Year |
2023 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
18 |
Issue |
9 |
Pages |
T09004 - 11pp |
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Abstract |
Metalenses and metasurfaces are promising emerging technologies that could improve light collection in light collection detectors, concentrating light on small area photodetectors such as silicon photomultipliers. Here we present a detailed method to characterize metalenses to assess their efficiency at concentrating monochromatic light coming from a wide range of incidence angles, not taking into account their imaging quality. |
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no |
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Is ISI |
yes |
International Collaboration |
yes |
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IFIC @ pastor @ |
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6086 |
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