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Author (up) Domingo-Pardo, C.; Goel, N.; Engert, T.; Gerl, J.; Kojouharov, I.; Schaffner, H.; Didierjean, F.; Duchene, G.; Sigward, M.H.
Title A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors Type Journal Article
Year 2011 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 643 Issue 1 Pages 79-88
Keywords gamma-detector; Pulse shape analysis; Tracking; Semiconductor
Abstract A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.
Address [Domingo-Pardo, C; Goel, N; Engert, T; Gerl, J; Kojouharov, I; Schaffner, H] GSI Helmholtzzentnim Schwenonenforsch mbH, D-64291 Darmstadt, Germany, Email: cesar.domingo@ific.uv.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000292442700014 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 694
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