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Author (up) Durieux, G.; Perello, M.; Vos, M.; Zhang, C. url  doi
openurl 
  Title Global and optimal probes for the top-quark effective field theory at future lepton colliders Type Journal Article
  Year 2018 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 10 Issue 10 Pages 168 - 68pp  
  Keywords Beyond Standard Model; Effective Field Theories; Heavy Quark Physics  
  Abstract We study the sensitivity to physics beyond the standard model of precise top-quark pair production measurements at future lepton colliders. A global effective-field-theory approach is employed, including all ten dimension-six operators of the Warsaw basis which involve a top-quark and give rise to tree-level amplitudes that interfere with standard-model e+e-tt ones in the limit of vanishing b-quark mass. Four-fermion and CP-violating contributions are taken into account. Circular-collider-, ILC- and CLIC-like benchmark run scenarios are examined. We compare the constraining power of various observables to a set of statistically optimal ones which maximally exploit the information contained in the fully differential bW+ distribution. The enhanced sensitivity gained on the linear contributions of dimension-six operators leads to bounds that are insensitive to quadratic ones. Even with statistically optimal observables, two centre-of-mass energies are required for constraining simultaneously two- and four-fermion operators. The impact of the centre-of-mass energy lever arm is discussed, that of beam polarization as well. A realistic estimate of the precision that can be achieved in ILC- and CLIC-like operating scenarios yields individual limits on the electroweak couplings of the top quark that are one to three orders of magnitude better than constraints set with Tevatron and LHC run I data, and three to two hundred times better than the most optimistic projections made for the high-luminosity phase of the LHC. Clean global constraints can moreover be obtained at lepton colliders, robustly covering the multidimensional effective-field-theory space with minimal model dependence.  
  Address [Durieux, Gauthier] DESY, Notkestr 85, D-22607 Hamburg, Germany, Email: gauthier.durieux@desy.de;  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000448812600001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3786  
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Author (up) Hiti, B.; Cindro, V.; Gorisek, A.; Franks, M.; Marco-Hernandez, R.; Kramberger, G.; Mandic, I.; Mikuz, M.; Powell, S.; Steininger, H.; Vilella, E.; Zavrtanik, M.; Zhang, C. url  doi
openurl 
  Title Characterisation of analogue front end and time walk in CMOS active pixel sensor Type Journal Article
  Year 2021 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 16 Issue 12 Pages P12020 - 12pp  
  Keywords Charge induction; Radiation-hard detectors; Solid state detectors  
  Abstract In this work we investigated a method to determine time walk in an active silicon pixel sensor prototype using Edge-TCT with infrared laser charge injection. Samples were investigated before and after neutron irradiation to 5 . 10(14) n(eq)/cm(2). Threshold, noise and calibration of the analogue front end were determined with external charge injection. A spatially sensitive measurement of collected charge and time walk was carried out with Edge-TCT, showing a uniform charge collection and output delay in pixel centre. On pixel edges charge sharing was observed due to finite beam width resulting in smaller signals and larger output delay. Time walk below 25 ns was observed for charge above 2000 e(-) at a threshold above the noise level. Time walk measurement with external charge injection yielded identical results.  
  Address [Hiti, B.; Cindro, V.; Gorisek, A.; Kramberger, G.; Mandic, I.; Mikuz, M.; Zavrtanik, M.] Jozef Stefan Inst, Jamova Cesta 39, Ljubljana, Slovenia, Email: bojan.hiti@ijs.si  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000758055400055 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5138  
Permanent link to this record
 

 
Author (up) Mandic, I.; Cindro, V.; Debevc, J.; Gorisek, A.; Hiti, B.; Kramberger, G.; Skomina, P.; Zavrtanik, M.; Mikuz, M.; Vilella, E.; Zhang, C.; Powell, S.; Franks, M.; Marco-Hernandez, R.; Steininger, H. url  doi
openurl 
  Title Study of neutron irradiation effects in Depleted CMOS detector structures Type Journal Article
  Year 2022 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 17 Issue 3 Pages P03030 - 13pp  
  Keywords Particle tracking detectors (Solid-state detectors); Si microstrip and pad detectors; Solid state detectors  
  Abstract In this paper the results of Edge-TCT and I-V measurements with passive test structures made in LFoundry 150 nm HV-CMOS process on p-type substrates with different initial resistivities ranging from 0.5 to 3 k Omega cm are presented. Samples were irradiated with reactor neutrons up to a fluence of 2.10(15) n(eq)/cm(2). The depletion depth was measured with Edge-TCT. The effective space charge concentration N-eff was estimated from the dependence of the depletion depth on bias voltage and studied as a function of neutron fluence. The dependence of N-eff on fluence changes with initial acceptor concentration in agreement with other measurements with p-type silicon. A long term accelerated annealing study of N-eff and detector current up to 1280 minutes at 60 degrees C was made. It was found that N-eff and current in reverse biased detector behave as expected for irradiated silicon.  
  Address [Mandic, I; Cindro, V; Debevc, J.; Gorisek, A.; Hiti, B.; Kramberger, G.; Skomina, P.; Zavrtanik, M.; Mikuz, M.] Jozef Stefan Inst, Jamova 39, Ljubljana, Slovenia, Email: igor.mandic@ijs.si  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000784713600004 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5208  
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