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Author NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air Type Journal Article
Year 2020 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume (up) 15 Issue 11 Pages P11031 - 16pp
Keywords Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC)
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000595650800024 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4633
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Author NEXT Collaboration; Carcel, S.; Carrion, J.V.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Mitigation of backgrounds from cosmogenic Xe-137 in xenon gas experiments using He-3 neutron capture Type Journal Article
Year 2020 Publication Journal of Physics G Abbreviated Journal J. Phys. G
Volume (up) 47 Issue 7 Pages 075001 - 17pp
Keywords gaseous detectors; scintillators; scintillation and light emission processes; solid; gas and liquid scintillators
Abstract Xe-136 is used as the target medium for many experiments searching for 0 nu beta beta. Despite underground operation, cosmic muons that reach the laboratory can produce spallation neutrons causing activation of detector materials. A potential background that is difficult to veto using muon tagging comes in the form of Xe-137 created by the capture of neutrons on Xe-136. This isotope decays via beta decay with a half-life of 3.8 min and a Q(beta) of similar to 4.16 MeV. This work proposes and explores the concept of adding a small percentage of He-3 to xenon as a means to capture thermal neutrons and reduce the number of activations in the detector volume. When using this technique we find the contamination from Xe-137 activation can be reduced to negligible levels in tonne and multi-tonne scale high pressure gas xenon neutrinoless double beta decay experiments running at any depth in an underground laboratory.
Address [Rogers, L.; Jones, B. J. P.; Laing, A.; Pingulkar, S.; Smithers, B.; Woodruff, K.; Byrnes, N.; Dingler, R.; McDonald, A. D.; Nygren, D. R.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: leslie.rogers@mavs.uta.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0954-3899 ISBN Medium
Area Expedition Conference
Notes WOS:000537753800001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4423
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Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N.
Title Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging Type Journal Article
Year 2018 Publication Physical Review Letters Abbreviated Journal Phys. Rev. Lett.
Volume (up) 120 Issue 13 Pages 132504 - 6pp
Keywords
Abstract A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers.
Address [McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu;
Corporate Author Thesis
Publisher Amer Physical Soc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0031-9007 ISBN Medium
Area Expedition Conference
Notes WOS:000428243400005 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3538
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Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N.
Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B
Volume (up) 773 Issue Pages 663-671
Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon
Abstract Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.
Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0370-2693 ISBN Medium
Area Expedition Conference
Notes WOS:000413294200099 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3342
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Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.
Title Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume (up) 877 Issue Pages 157-172
Keywords Optical TPCs; Microscopic simulation; Xenon scintillation
Abstract We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.
Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000415128000022 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3371
Permanent link to this record