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Contreras, T.; Martins, A.; Stanford, C.; Escobar, C.O.; Guenette, R.; Stancari, M.; Martin-Albo, J.; Lawrence-Sanderson, B.; Para, A.; Kish, A.; Kellerer, F. A method to characterize metalenses for light collection applications 2023 Journal of Instrumentation 18 T09004 - 11pp details   doi
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