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Author NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Neutral Bremsstrahlung Emission in Xenon Unveiled Type Journal Article
Year 2022 Publication Physical Review X Abbreviated Journal Phys. Rev. X
Volume 12 Issue 2 Pages 021005 - 23pp
Keywords
Abstract We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1).
Address [Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt;
Corporate Author Thesis
Publisher Amer Physical Soc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 2160-3308 ISBN Medium
Area Expedition Conference
Notes WOS:000792590100001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 5220
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Author NEXT Collaboration (Simon, A. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Boosting background suppression in the NEXT experiment through Richardson-Lucy deconvolution Type Journal Article
Year 2021 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 07 Issue 7 Pages 146 - 38pp
Keywords Dark Matter and Double Beta Decay (experiments)
Abstract Next-generation neutrinoless double beta decay experiments aim for half-life sensitivities of similar to 10(27) yr, requiring suppressing backgrounds to < 1 count/tonne/yr. For this, any extra background rejection handle, beyond excellent energy resolution and the use of extremely radiopure materials, is of utmost importance. The NEXT experiment exploits differences in the spatial ionization patterns of double beta decay and single-electron events to discriminate signal from background. While the former display two Bragg peak dense ionization regions at the opposite ends of the track, the latter typically have only one such feature. Thus, comparing the energies at the track extremes provides an additional rejection tool. The unique combination of the topology-based background discrimination and excellent energy resolution (1% FWHM at the Q-value of the decay) is the distinguishing feature of NEXT. Previous studies demonstrated a topological background rejection factor of <similar to> 5 when reconstructing electron-positron pairs in the Tl-208 1.6 MeV double escape peak (with Compton events as background), recorded in the NEXT-White demonstrator at the Laboratorio Subterraneo de Canfranc, with 72% signal efficiency. This was recently improved through the use of a deep convolutional neural network to yield a background rejection factor of similar to 10 with 65% signal efficiency. Here, we present a new reconstruction method, based on the Richardson-Lucy deconvolution algorithm, which allows reversing the blurring induced by electron diffusion and electroluminescence light production in the NEXT TPC. The new method yields highly refined 3D images of reconstructed events, and, as a result, significantly improves the topological background discrimination. When applied to real-data 1.6 MeV e(-)e(+) pairs, it leads to a background rejection factor of 27 at 57% signal efficiency.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA USA, Email: ander@post.bgu.ac.il;
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000677621700001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4906
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Author NEXT Collaboration (Kekic, M. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Demonstration of background rejection using deep convolutional neural networks in the NEXT experiment Type Journal Article
Year 2021 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 01 Issue 1 Pages 189 - 22pp
Keywords Dark Matter and Double Beta Decay (experiments)
Abstract Convolutional neural networks (CNNs) are widely used state-of-the-art computer vision tools that are becoming increasingly popular in high-energy physics. In this paper, we attempt to understand the potential of CNNs for event classification in the NEXT experiment, which will search for neutrinoless double-beta decay in Xe-136. To do so, we demonstrate the usage of CNNs for the identification of electron-positron pair production events, which exhibit a topology similar to that of a neutrinoless double-beta decay event. These events were produced in the NEXT-White high-pressure xenon TPC using 2.6 MeV gamma rays from a Th-228 calibration source. We train a network on Monte Carlo-simulated events and show that, by applying on-the-fly data augmentation, the network can be made robust against differences between simulation and data. The use of CNNs offers significant improvement in signal efficiency and background rejection when compared to previous non-CNN-based analyses.
Address [Hauptman, J.; Nygren, D. R.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: marija.kekic@usc.es
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000616730800001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4729
Permanent link to this record
 

 
Author NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air Type Journal Article
Year 2020 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 15 Issue 11 Pages P11031 - 16pp
Keywords Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC)
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000595650800024 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4633
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Author NEXT Collaboration (Martinez-Lema, G. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Sensitivity of the NEXT experiment to Xe-124 double electron capture Type Journal Article
Year 2021 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 02 Issue 2 Pages 203 - 25pp
Keywords Dark Matter and Double Beta Decay (experiments)
Abstract Double electron capture by proton-rich nuclei is a second-order nuclear process analogous to double beta decay. Despite their similarities, the decay signature is quite different, potentially providing a new channel to measure the hypothesized neutrinoless mode of these decays. The Standard-Model-allowed two-neutrino double electron capture (2 nu EC EC) has been predicted for a number of isotopes, but only observed in Kr-78, Ba-130 and, recently, Xe-124. The sensitivity to this decay establishes a benchmark for the ultimate experimental goal, namely the potential to discover also the lepton-number-violating neutrinoless version of this process, 0 nu EC EC. Here we report on the current sensitivity of the NEXT-White detector to Xe-124 2 nu EC EC and on the extrapolation to NEXT-100. Using simulated data for the 2 nu EC EC signal and real data from NEXT-White operated with Xe-124-depleted gas as background, we define an optimal event selection that maximizes the NEXT-White sensitivity. We estimate that, for NEXT-100 operated with xenon gas isotopically enriched with 1 kg of Xe-124 and for a 5-year run, a sensitivity to the 2 nu EC EC half-life of 6 x 10(22) y (at 90% confidence level) or better can be reached.
Address [Goldschmidt, A.; Hauptman, J.; Laing, A.; Martinez, A.; Para, A.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: gonzalo.martinez.lema@weizmann.ac.il
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000624564800002 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4749
Permanent link to this record