|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Real, D.; Calvo, D.; Diaz, A.; Alves Garre, S.; Carretero, V.; Sanchez Losa, A.; Salesa Greus, F. |
An Ultra-Narrow Time Optical Pulse Emitter Based on a Laser: UNTOPEL |
2023 |
IEEE Transactions on Nuclear Science |
70 |
2364-2372 |
|
|
Escribano, P.; Vicente, A. |
An ultraviolet completion for the Scotogenic model |
2021 |
Physics Letters B |
823 |
136717 - 7pp |
|
|
Araujo Filho, A.A. |
Analysis of a regular black hole in Verlinde's gravity |
2024 |
Classical and Quantum Gravity |
41 |
015003 - 30pp |
|
|
LHCb Collaboration (Aaij, R. et al); Jashal, B.K.; Martinez-Vidal, F.; Oyanguren, A.; Remon Alepuz, C.; Ruiz Vidal, J. |
Analysis of Neutral B-Meson Decays into Two Muons |
2022 |
Physical Review Letters |
128 |
041801 - 13pp |
|
|
Garcia Canal, C.A.; Tarutina, T.; Vento, V. |
Analysis of Nuclear Effects in Structure Functions and Their Connection with the Binding Energy of Nuclei |
2023 |
Brazilian Journal of Physics |
53 |
161 - 8pp |
|
|
Wang, E.; Xie, J.J.; Geng, L.S.; Oset, E. |
Analysis of the B+ -> J/Psi phi K+ data at low J/Psi phi invariant masses and the X(4140) and X(4160) resonances |
2018 |
Physical Review D |
97 |
014017 - 6pp |
|
|
Wang, E.; Liang, W.H.; Oset, E. |
Analysis of the e(+)e(-) -> J/psi D(D)over-bar reaction close to the threshold concerning claims of a chi(c0)(2P) state |
2021 |
European Physical Journal A |
57 |
38 - 9pp |
|
|
Wang, E.; Li, H.S.; Liang, W.H.; Oset, E. |
Analysis of the gamma gamma -> D(D)over-bar reaction and the D(D)over-bar bound state |
2021 |
Physical Review D |
103 |
054008 - 10pp |
|
|
Renteria-Estrada, D.F.; Hernandez-Pinto, R.J.; Sborlini, G.F.R. |
Analysis of the Internal Structure of Hadrons Using Direct Photon Production |
2021 |
Symmetry-Basel |
13 |
942 - 10pp |
|
|
Gonzalez-Iglesias, D.; Esperante, D.; Gimeno, B.; Blanch, C.; Fuster-Martinez, N.; Martinez-Reviriego, P.; Martin-Luna, P.; Fuster, J.; Alesini, D. |
Analysis of the Multipactor Effect in an RF Electron Gun Photoinjector |
2023 |
IEEE Transactions on Electron Devices |
70 |
288-295 |
|