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NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging |
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Journal Article |
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Year |
2018 |
Publication  |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume |
120 |
Issue |
13 |
Pages |
132504 - 6pp |
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Abstract |
A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers. |
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Address |
[McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu; |
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Amer Physical Soc |
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English |
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0031-9007 |
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WOS:000428243400005 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3538 |
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Author |
NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection |
Type |
Journal Article |
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Year |
2017 |
Publication |
Physics Letters B |
Abbreviated Journal |
Phys. Lett. B |
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Volume |
773 |
Issue |
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Pages |
663-671 |
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Keywords |
Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon |
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Abstract |
Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2. |
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Address |
[Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt |
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Elsevier Science Bv |
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English |
Summary Language |
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Edition |
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ISSN |
0370-2693 |
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Notes |
WOS:000413294200099 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3342 |
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