| Records |
| Author |
NEXT Collaboration (Alvarez, V. et al); Agramunt, J.; Ball, M.; Bayarri, J.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Gonzalez, K.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Perez, J.; Rodriguez, J.; Serra, L.; Sorel, M.; Yahlali, N. |
| Title |
SiPMs coated with TPB: coating protocol and characterization for NEXT |
Type |
Journal Article |
| Year |
2012 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
| Volume |
7 |
Issue |
|
Pages |
P02010 |
| Keywords |
|
| Abstract |
Silicon photomultipliers (SiPM) are the photon detectors chosen for the tracking read-out in NEXT, a neutrinoless beta beta decay experiment which uses a high pressure gaseous xenon time projection chamber (TPC). The reconstruction of event track and topology in this gaseous detector is a key handle for background rejection. Among the commercially available sensors that can be used for tracking, SiPMs offer important advantages, mainly high gain, ruggedness, cost-effectiveness and radio-purity. Their main drawback, however, is their non sensitivity in the emission spectrum of the xenon scintillation (peak at 175 nm). This is overcome by coating these sensors with the organic wavelength shifter tetraphenyl butadiene (TPB). In this paper we describe the protocol developed for coating the SiPMs with TPB and the measurements performed for characterizing the coatings as well as the performance of the coated sensors in the UV-VUV range. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
Language  |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1748-0221 |
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
WOS:000303940900076 |
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
1028 |
| Permanent link to this record |
| |
|
| |
| Author |
Contreras, T.; Martins, A.; Stanford, C.; Escobar, C.O.; Guenette, R.; Stancari, M.; Martin-Albo, J.; Lawrence-Sanderson, B.; Para, A.; Kish, A.; Kellerer, F. |
| Title |
A method to characterize metalenses for light collection applications |
Type |
Journal Article |
| Year |
2023 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
| Volume |
18 |
Issue |
9 |
Pages |
T09004 - 11pp |
| Keywords |
|
| Abstract |
Metalenses and metasurfaces are promising emerging technologies that could improve light collection in light collection detectors, concentrating light on small area photodetectors such as silicon photomultipliers. Here we present a detailed method to characterize metalenses to assess their efficiency at concentrating monochromatic light coming from a wide range of incidence angles, not taking into account their imaging quality. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
|
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Is ISI |
yes |
International Collaboration |
yes |
| Call Number |
IFIC @ pastor @ |
Serial |
6086 |
| Permanent link to this record |
