|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Ionization and scintillation response of high-pressure xenon gas to alpha particles |
2013 |
Journal of Instrumentation |
8 |
P05025 - 35pp |
|
|
NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N. |
An improved measurement of electron-ion recombination in high-pressure xenon gas |
2015 |
Journal of Instrumentation |
10 |
P03025 - 21pp |
|
|
NEXT Collaboration (Lorca, D. et al); Martin-Albo, J.; Laing, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Characterisation of NEXT-DEMO using xenon K-alpha X-rays |
2014 |
Journal of Instrumentation |
9 |
P10007 - 20pp |
|
|
Alvarez, V.; Herrero-Bosch, V.; Esteve, R.; Laing, A.; Rodriguez, J.; Querol, M.; Monrabal, F.; Toledo, J.F.; Gomez-Cadenas, J.J. |
The electronics of the energy plane of the NEXT-White detector |
2019 |
Nuclear Instruments & Methods in Physics Research A |
917 |
68-76 |
|
|
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |
|