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Author |
NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection |
Type |
Journal Article |
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Year |
2017 |
Publication |
Physics Letters B |
Abbreviated Journal |
Phys. Lett. B |
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Volume |
773 |
Issue |
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Pages |
663-671 |
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Keywords  |
Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon |
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Abstract |
Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2. |
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Address |
[Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt |
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Publisher |
Elsevier Science Bv |
Place of Publication |
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Language |
English |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0370-2693 |
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Expedition |
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Conference |
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Notes |
WOS:000413294200099 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3342 |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Publisher |
Iop Publishing Ltd |
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English |
Summary Language |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
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Expedition |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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Author |
NEXT Collaboration (Mistry, K. et al); Carcel, S.; Lopez-March, N.; Martin-Albo, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A. |
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Title |
Design, characterization and installation of the NEXT-100 cathode and electroluminescence regions |
Type |
Journal Article |
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Year |
2024 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
19 |
Issue |
2 |
Pages |
P02007 - 36pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Charge transport; multiplication and electroluminescence in rare gases and liquids; Time projection Chambers (TPC) |
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Abstract |
NEXT -100 is currently being constructed at the Laboratorio Subterraneo de Canfranc in the Spanish Pyrenees and will search for neutrinoless double beta decay using a high-pressure gaseous time projection chamber (TPC) with 100 kg of xenon. Charge amplification is carried out via electroluminescence (EL) which is the process of accelerating electrons in a high electric field region causing secondary scintillation of the medium proportional to the initial charge. The NEXT -100 EL and cathode regions are made from tensioned hexagonal meshes of 1 m diameter. This paper describes the design, characterization, and installation of these parts for NEXT -100. Simulations of the electric field are performed to model the drift and amplification of ionization electrons produced in the detector under various EL region alignments and rotations. Measurements of the electrostatic breakdown voltage in air characterize performance under high voltage conditions and identify breakdown points. The electrostatic deflection of the mesh is quantified and fit to a first -pr inciples mechanical model. Measurements were performed with both a standalone test EL region and with the NEXT-100 EL region before its installation in the detector. Finally, we describe the parts as installed in NEXT-100, following their deployment in Summer 2023. |
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Address |
[Mistry, K.; Jones, B. J. P.; Munson, B.; Norman, L.; Oliver, D.; Pingulkar, S.; Rodriguez-Tiscareno, M.; Silva, K.; Stogsdill, K.; Byrnes, N.; Dey, E.; Navarro, K. E.; Nygren, D. R.; Parmaksiz, I.] Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA, Email: next-src@pegaso.ific.uv.es |
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Publisher |
IOP Publishing Ltd |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:001185791500003 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
6071 |
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Author |
NEXT Collaboration (Ferrario, P. et al); Laing, A.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
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Title |
First proof of topological signature in the high pressure xenon gas TPC with electroluminescence amplification for the NEXT experiment |
Type |
Journal Article |
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Year |
2016 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
01 |
Issue |
1 |
Pages |
104 - 18pp |
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Keywords |
Dark Matter; Double Beta Decay |
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Abstract |
The NEXT experiment aims to observe the neutrinoless double beta decay of Xe-136 in a high-pressure xenon gas TPC using electroluminescence (EL) to amplify the signal from ionization. One of the main advantages of this technology is the possibility to reconstruct the topology of events with energies close to Q(beta beta). This paper presents the first demonstration that the topology provides extra handles to reject background events using data obtained with the NEXT-DEMO prototype. Single electrons resulting from the interactions of Na-22 1275 keV gammas and electron-positron pairs produced by conversions of gammas from the Th-228 decay chain were used to represent the background and the signal in a double beta decay. These data were used to develop algorithms for the reconstruction of tracks and the identification of the energy deposited at the end-points, providing an extra background rejection factor of 24.3 +/- 1.4 (stat.)%, while maintaining an efficiency of 66.7 +/- 1.% for signal events. |
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Address |
[Ferrario, P.; Laing, A.; Lopez-March, N.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Jose Beltran 2, Valencia 46980, Spain, Email: paola.ferrario@ific.uv.es |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Expedition |
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Conference |
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Notes |
WOS:000370438900001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
2560 |
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| Permanent link to this record |
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Author |
NEXT Collaboration (Martin-Albo, J. et al); Muñoz Vidal, J.; Ferrario, P.; Nebot-Guinot, M.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Novella, P.; Palmeiro, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
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Title |
Sensitivity of NEXT-100 to neutrinoless double beta decay |
Type |
Journal Article |
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Year |
2016 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
05 |
Issue |
5 |
Pages |
159 - 30pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments); Rare decay |
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Abstract |
NEXT-100 is an electroluminescent high-pressure xenon gas time projection chamber that will search for the neutrinoless double beta (0v beta beta) decay of Xe-136. The detector possesses two features of great value for 0v beta beta searches: energy resolution better than 1% FWHM at the Q value of Xe-136 and track reconstruction for the discrimination of signal and background events. This combination results in excellent sensitivity, as discussed in this paper. Material-screening measurements and a detailed Monte Carlo detector simulation predict a background rate for NEXT-100 of at most 4 x 10(-4) counts keV(-1) kg(-1) yr(-1). Accordingly, the detector will reach a sensitivity to the 0v beta beta-decay half-life of 2.8 x 10(25) years (90% CL) for an exposure of 100 kg.year, or 6.0 x 10(25) years after a run of 3 effective years. |
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Address |
[Martin-Albo, J.; Munoz Vidal, J.; Ferrario, P.; Nebot-Guinot, M.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Carrion, J. V.; Cervera, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: justo.martin-albo@ific.uv.es |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000391745200003 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
2928 |
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