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Wieduwilt, P., Paschen, B., Schreeck, H., Schwenker, B., Soltau, J., Ahlburg, P., et al. (2021). Performance of production modules of the Belle II pixel detector in a high-energy particle beam. Nucl. Instrum. Methods Phys. Res. A, 991, 164978–15pp.
Abstract: The Belle II experiment at the Super B factory SuperKEKB, an asymmetric e(+) e(-) collider located in Tsukuba, Japan, is tailored to perform precision B physics measurements. The centre of mass energy of the collisions is equal to the rest mass of the gamma (4S) resonance of m(gamma(4S)) = 10.58 GeV. A high vertex resolution is essential for measuring the decay vertices of B mesons. Typical momenta of the decay products are ranging from a few tens of MeV to a few GeV and multiple scattering has a significant impact on the vertex resolution. The VerteX Detector (VXD) for Belle II is therefore designed to have as little material as possible inside the acceptance region. Especially the innermost two layers, populated by the PiXel Detector (PXD), have to be ultra-thin. The PXD is based on DEpleted P-channel Field Effect Transistors (DEPFETs) with a thickness of only 75 μm. Spatial resolution and hit efficiency of production detector modules were studied in beam tests performed at the DESY test beam facility. The spatial resolution was investigated as a function of the incidence angle and improvements due to charge sharing are demonstrated. The measured module performance is compatible with the requirements for Belle II.
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Schreeck, H., Paschen, B., Wieduwilt, P., Ahlburg, P., Andricek, L., Dingfelder, J., et al. (2020). Effects of gamma irradiation on DEPFET pixel sensors for the Belle II experiment. Nucl. Instrum. Methods Phys. Res. A, 959, 163522–9pp.
Abstract: For the Belle II experiment at KEK (Tsukuba, Japan) the KEKB accelerator was upgraded to deliver a 40 times larger instantaneous luminosity than before, which requires an increased radiation hardness of the detector components. As the innermost part of the Belle II detector, the pixel detector (PXD), based on DEPFET (DEpleted P-channel Field Effect Transistor) technology, is most exposed to radiation from the accelerator. An irradiation campaign was performed to verify that the PXD can cope with the expected amount of radiation. We present the results of this measurement campaign in which an X-ray machine was used to irradiate a single PXD half-ladder to a total dose of 266 kGy. The half-ladder is from the same batch as the half-ladders used for Belle II. According to simulations, the total accumulated dose corresponds to 7-10 years of Belle II operation. While individual components have been irradiated before, this campaign is the first full system irradiation. We discuss the effects on the DEPFET sensors, as well as the performance of the front-end electronics. In addition, we present efficiency studies of the half-ladder from beam tests performed before and after the irradiation.
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ATLAS Tile Calorimeter System(Abdallah, J. et al), Ferrer, A., Fiorini, L., Hernandez Jimenez, Y., Higon-Rodriguez, E., Ruiz-Martinez, A., et al. (2016). The Laser calibration of the ATLAS Tile Calorimeter during the LHC run 1. J. Instrum., 11, T10005–29pp.
Abstract: This article describes the Laser calibration system of the ATLAS hadronic Tile Calorimeter that has been used during the run 1 of the LHC. First, the stability of the system associated readout electronics is studied. It is found to be stable with variations smaller than 0.6 %. Then, the method developed to compute the calibration constants, to correct for the variations of the gain of the calorimeter photomultipliers, is described. These constants were determined with a statistical uncertainty of 0.3 % and a systematic uncertainty of 0.2 % for the central part of the calorimeter and 0.5 % for the end-caps. Finally, the detection and correction of timing mis-configuration of the Tile Calorimeter using the Laser system are also presented.
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NEXT Collaboration(Mistry, K. et al), Carcel, S., Lopez-March, N., Martin-Albo, J., Novella, P., Querol, M., et al. (2024). Design, characterization and installation of the NEXT-100 cathode and electroluminescence regions. J. Instrum., 19(2), P02007–36pp.
Abstract: NEXT -100 is currently being constructed at the Laboratorio Subterraneo de Canfranc in the Spanish Pyrenees and will search for neutrinoless double beta decay using a high-pressure gaseous time projection chamber (TPC) with 100 kg of xenon. Charge amplification is carried out via electroluminescence (EL) which is the process of accelerating electrons in a high electric field region causing secondary scintillation of the medium proportional to the initial charge. The NEXT -100 EL and cathode regions are made from tensioned hexagonal meshes of 1 m diameter. This paper describes the design, characterization, and installation of these parts for NEXT -100. Simulations of the electric field are performed to model the drift and amplification of ionization electrons produced in the detector under various EL region alignments and rotations. Measurements of the electrostatic breakdown voltage in air characterize performance under high voltage conditions and identify breakdown points. The electrostatic deflection of the mesh is quantified and fit to a first -pr inciples mechanical model. Measurements were performed with both a standalone test EL region and with the NEXT-100 EL region before its installation in the detector. Finally, we describe the parts as installed in NEXT-100, following their deployment in Summer 2023.
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NEXT Collaboration(Ghosh, S. et al), Martin-Albo, J., Carcel, S., Carrion, J. V., Diaz, J., Felkai, R., et al. (2020). Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air. J. Instrum., 15(11), P11031–16pp.
Abstract: Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
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