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Author |
Bevan, A.J. et al; Martinez-Vidal, F.; Pich, A.; Azzolini, V.; Bernabeu, J.; Lopez-March, N.; Milanes, D.A.; Oyanguren, A.; Villanueva-Perez, P. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
The Physics of the B Factories |
Type |
Journal Article |
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Year |
2014 |
Publication |
European Physical Journal C |
Abbreviated Journal |
Eur. Phys. J. C |
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Volume |
74 |
Issue ![sorted by Issue field, ascending order (up)](img/sort_asc.gif) |
11 |
Pages |
3026 - 916pp |
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Address |
[Bevan, A. J.; Azzopardi, D. E.; Bellodi, G.; Clarke, C. K.; Cormack, C. M.; Dixon, P.; George, K. A.; Di Lodovico, F.; Menges, W.; Newman-Coburn, D.; Potter, R. J. L.; Sacco, R.; Shorthouse, H. W.; Sigamani, M.; Strother, P.; Vidal, P. B.; Williams, M. I.] Univ London, London E1 4NS, England |
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Publisher |
Springer |
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English |
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ISSN |
1434-6044 |
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Notes |
WOS:000347169500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
2074 |
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Permanent link to this record |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue ![sorted by Issue field, ascending order (up)](img/sort_asc.gif) |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Publisher |
Iop Publishing Ltd |
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English |
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ISSN |
1748-0221 |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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Permanent link to this record |
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Author |
BABAR Collaboration (del Amo Sanchez, P. et al); Lopez-March, N.; Martinez-Vidal, F.; Milanes, D.A.; Oyanguren, A. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Evidence for Direct CP Violation in the Measurement of the Cabbibo-Kobayashi-Maskawa Angle gamma with B-/+ -> D-(*K-)(()*()-/+) Decays |
Type |
Journal Article |
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Year |
2010 |
Publication |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume |
105 |
Issue ![sorted by Issue field, ascending order (up)](img/sort_asc.gif) |
12 |
Pages |
121801 - 7pp |
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Abstract |
We report the measurement of the Cabibbo-Kobayashi-Maskawa CP-violating angle gamma through a Dalitz plot analysis of neutral D-meson decays to K-S(0)pi(+) pi(-) and K-S(0) K+ K- produced in the processes B--/+ -> DK -/+, B--/+ -> D* K--/+ with D* -> D pi(0), D gamma and B -/+ DK*-/+ with K*(-/+) -> K-S(0)pi(-/+), using 468 million B (B) over bar pairs collected by the BABAR detector at the PEP-II asymmetric-energy e(+)e(-) collider at SLAC. We measure gamma = (68 +/- 14 +/- 4 +/- 3)degrees (modulo 180 degrees), where the first error is statistical, the second is the experimental systematic uncertainty, and the third reflects the uncertainty in the description of the neutral D decay amplitudes. This result is inconsistent with gamma = 0 ( no direct CP violation) with a significance of 3.5 standard deviations. |
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Address |
[Sanchez, P. del Amo; Lees, J. P.; Poireau, V.; Prencipe, E.; Tisserand, V.] Univ Savoie, CNRS, IN2P3, Lab Annecy Le Vieux Phys Particules, F-74941 Annecy Le Vieux, France |
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Publisher |
Amer Physical Soc |
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English |
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ISSN |
0031-9007 |
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Conference |
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Notes |
ISI:000282137400002 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ elepoucu @ |
Serial |
376 |
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Permanent link to this record |
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Author |
NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging |
Type |
Journal Article |
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Year |
2018 |
Publication |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume |
120 |
Issue ![sorted by Issue field, ascending order (up)](img/sort_asc.gif) |
13 |
Pages |
132504 - 6pp |
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Keywords |
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Abstract |
A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers. |
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Address |
[McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu; |
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Publisher |
Amer Physical Soc |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0031-9007 |
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Conference |
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Notes |
WOS:000428243400005 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3538 |
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Permanent link to this record |
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Author |
BABAR Collaboration (Lees, J.P. et al); Azzolini, V.; Lopez-March, N.; Martinez-Vidal, F.; Milanes, D.A.; Oyanguren, A. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Search for Charged Lepton Flavor Violation in Narrow Gamma Decays |
Type |
Journal Article |
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Year |
2010 |
Publication |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume |
104 |
Issue ![sorted by Issue field, ascending order (up)](img/sort_asc.gif) |
15 |
Pages |
151802 - 7pp |
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Keywords |
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Abstract |
Charged-lepton flavor-violating processes are unobservable in the standard model, but they are predicted to be enhanced in several extensions to the standard model, including supersymmetry and models with leptoquarks or compositeness. We present a search for such processes in a sample of 99 x 10(6)Gamma(2S) decays and 117 x 10(6)Gamma(3S) decays collected with the BABAR detector. We place upper limits on the branching fractions B(Gamma(nS) --> e(+/-)tau(-/+)) and B(Gamma(n(S) --> mu(+/-)tau(-/+)) (n = 2, 3) at the 10(-6) level and use these results to place lower limits of order 1 TeV on the mass scale of charged-lepton flavor-violating effective operators. |
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Address |
[Lees, J. P.; Poireau, V.; Prencipe, E.; Tisserand, V.] Univ Savoie, CNRS, IN2P3, Lab Annecy Le Vieux Phys Particules, F-74941 Annecy Le Vieux, France |
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Corporate Author |
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Thesis |
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Publisher |
Amer Physical Soc |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0031-9007 |
ISBN |
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Expedition |
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Conference |
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Notes |
ISI:000277001700010 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ elepoucu @ |
Serial |
467 |
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Permanent link to this record |