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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue  |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Iop Publishing Ltd |
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English |
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ISSN |
1748-0221 |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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Author |
NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging |
Type |
Journal Article |
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Year |
2018 |
Publication |
Physical Review Letters |
Abbreviated Journal |
Phys. Rev. Lett. |
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Volume |
120 |
Issue |
13 |
Pages |
132504 - 6pp |
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Keywords |
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Abstract |
A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers. |
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Address |
[McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu; |
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Amer Physical Soc |
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English |
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ISSN |
0031-9007 |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000428243400005 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3538 |
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Author |
NEXT Collaboration (Martinez-Lema, G. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Sensitivity of the NEXT experiment to Xe-124 double electron capture |
Type |
Journal Article |
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Year |
2021 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
02 |
Issue |
2 |
Pages |
203 - 25pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments) |
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Abstract |
Double electron capture by proton-rich nuclei is a second-order nuclear process analogous to double beta decay. Despite their similarities, the decay signature is quite different, potentially providing a new channel to measure the hypothesized neutrinoless mode of these decays. The Standard-Model-allowed two-neutrino double electron capture (2 nu EC EC) has been predicted for a number of isotopes, but only observed in Kr-78, Ba-130 and, recently, Xe-124. The sensitivity to this decay establishes a benchmark for the ultimate experimental goal, namely the potential to discover also the lepton-number-violating neutrinoless version of this process, 0 nu EC EC. Here we report on the current sensitivity of the NEXT-White detector to Xe-124 2 nu EC EC and on the extrapolation to NEXT-100. Using simulated data for the 2 nu EC EC signal and real data from NEXT-White operated with Xe-124-depleted gas as background, we define an optimal event selection that maximizes the NEXT-White sensitivity. We estimate that, for NEXT-100 operated with xenon gas isotopically enriched with 1 kg of Xe-124 and for a 5-year run, a sensitivity to the 2 nu EC EC half-life of 6 x 10(22) y (at 90% confidence level) or better can be reached. |
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Address |
[Goldschmidt, A.; Hauptman, J.; Laing, A.; Martinez, A.; Para, A.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: gonzalo.martinez.lema@weizmann.ac.il |
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Publisher |
Springer |
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English |
Summary Language |
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Original Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
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Conference |
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Notes |
WOS:000624564800002 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4749 |
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| Permanent link to this record |
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Author |
NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Neutral Bremsstrahlung Emission in Xenon Unveiled |
Type |
Journal Article |
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Year |
2022 |
Publication |
Physical Review X |
Abbreviated Journal |
Phys. Rev. X |
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Volume |
12 |
Issue |
2 |
Pages |
021005 - 23pp |
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Keywords |
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Abstract |
We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1). |
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Address |
[Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt; |
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Publisher |
Amer Physical Soc |
Place of Publication |
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Editor |
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English |
Summary Language |
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Original Title |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
2160-3308 |
ISBN |
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Conference |
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Notes |
WOS:000792590100001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
5220 |
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| Permanent link to this record |
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Author |
NEXT Collaboration (Fernandes, A.F.M. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
04 |
Issue |
4 |
Pages |
034 - 18pp |
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Keywords |
Particle correlations and fluctuations; Photon production; Dark Matter and Double Beta Decay (experiments); Rare decay |
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Abstract |
High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: cristinam@uc.pt |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000525257400001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4366 |
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| Permanent link to this record |
