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Author NEXT Collaboration (Kekic, M. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Demonstration of background rejection using deep convolutional neural networks in the NEXT experiment Type Journal Article
  Year 2021 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 01 Issue 1 Pages 189 - 22pp  
  Keywords Dark Matter and Double Beta Decay (experiments)  
  Abstract Convolutional neural networks (CNNs) are widely used state-of-the-art computer vision tools that are becoming increasingly popular in high-energy physics. In this paper, we attempt to understand the potential of CNNs for event classification in the NEXT experiment, which will search for neutrinoless double-beta decay in Xe-136. To do so, we demonstrate the usage of CNNs for the identification of electron-positron pair production events, which exhibit a topology similar to that of a neutrinoless double-beta decay event. These events were produced in the NEXT-White high-pressure xenon TPC using 2.6 MeV gamma rays from a Th-228 calibration source. We train a network on Monte Carlo-simulated events and show that, by applying on-the-fly data augmentation, the network can be made robust against differences between simulation and data. The use of CNNs offers significant improvement in signal efficiency and background rejection when compared to previous non-CNN-based analyses.  
  Address [Hauptman, J.; Nygren, D. R.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: marija.kekic@usc.es  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000616730800001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4729  
Permanent link to this record
 

 
Author NEXT Collaboration (Martinez-Lema, G. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Sensitivity of the NEXT experiment to Xe-124 double electron capture Type Journal Article
  Year 2021 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 02 Issue 2 Pages 203 - 25pp  
  Keywords Dark Matter and Double Beta Decay (experiments)  
  Abstract Double electron capture by proton-rich nuclei is a second-order nuclear process analogous to double beta decay. Despite their similarities, the decay signature is quite different, potentially providing a new channel to measure the hypothesized neutrinoless mode of these decays. The Standard-Model-allowed two-neutrino double electron capture (2 nu EC EC) has been predicted for a number of isotopes, but only observed in Kr-78, Ba-130 and, recently, Xe-124. The sensitivity to this decay establishes a benchmark for the ultimate experimental goal, namely the potential to discover also the lepton-number-violating neutrinoless version of this process, 0 nu EC EC. Here we report on the current sensitivity of the NEXT-White detector to Xe-124 2 nu EC EC and on the extrapolation to NEXT-100. Using simulated data for the 2 nu EC EC signal and real data from NEXT-White operated with Xe-124-depleted gas as background, we define an optimal event selection that maximizes the NEXT-White sensitivity. We estimate that, for NEXT-100 operated with xenon gas isotopically enriched with 1 kg of Xe-124 and for a 5-year run, a sensitivity to the 2 nu EC EC half-life of 6 x 10(22) y (at 90% confidence level) or better can be reached.  
  Address [Goldschmidt, A.; Hauptman, J.; Laing, A.; Martinez, A.; Para, A.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: gonzalo.martinez.lema@weizmann.ac.il  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000624564800002 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4749  
Permanent link to this record
 

 
Author Gomez-Cadenas, J.J.; Benlloch-Rodriguez, J.M.; Ferrario, P. doi  openurl
  Title Application of scintillating properties of liquid xenon and silicon photomultiplier technology to medical imaging Type Journal Article
  Year 2016 Publication Spectrochimica Acta Part B Abbreviated Journal Spectroc. Acta Pt. B  
  Volume 118 Issue Pages 6-13  
  Keywords PET; TOF; Liquid xenon; Energy resolution; High sensitivity; Coincidence resolution time (CRT); SiPMs  
  Abstract We describe a new positron emission time-of-flight apparatus using liquid xenon. The detector is based in a liquid xenon scintillating cell. The cell shape and dimensions can be optimized depending on the intended application. In its simplest form, the liquid xenon scintillating cell is a box in which two faces are covered by silicon photomultipliers and the others by a reflecting material such as Teflon. It is a compact, homogenous and highly efficient detector which shares many of the desirable properties of monolithic crystals, with the added advantage of high yield and fast scintillation offered by liquid xenon. Our initial studies suggest that good energy and spatial resolution comparable with that achieved by lutetium oxyorthosilicate crystals can be obtained with a detector based in liquid xenon scintillating cells. In addition, the system can potentially achieve an excellent coincidence resolving time of better than 100 ps.  
  Address [Gomez-Cadenas, J. J.; Benlloch-Rodriguez, J. M.; Ferrario, Paola] Univ Valencia, CSIC, IFIC, E-46003 Valencia, Spain, Email: gomez@mail.cern.ch  
  Corporate Author Thesis  
  Publisher Pergamon-Elsevier Science Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0584-8547 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000374073300002 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ pastor @ Serial 2631  
Permanent link to this record
 

 
Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
  Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 773 Issue Pages 663-671  
  Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon  
  Abstract Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.  
  Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000413294200099 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3342  
Permanent link to this record
 

 
Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 877 Issue Pages 157-172  
  Keywords Optical TPCs; Microscopic simulation; Xenon scintillation  
  Abstract We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.  
  Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000415128000022 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3371  
Permanent link to this record
 

 
Author NEXT Collaboration (Trindade, A.M.F. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. doi  openurl
  Title Study of the loss of xenon scintillation in xenon-trimethylamine mixtures Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 905 Issue Pages 22-28  
  Keywords Gaseous radiation detectors; Noble gas mixtures; Molecular additives; VUV absorption  
  Abstract This work investigates the capability of TMA ((CH3)(3)N) molecules to shift the wavelength of Xe VUV emission (160-188 nm) to a longer, more manageable, wavelength (260-350 nm). Light emitted from a Xe lamp was passed through a gas chamber filled with Xe-TMA mixtures at 800 Torr and detected with a photomultiplier tube. Using bandpass filters in the proper transmission ranges, no reemitted light was observed experimentally. Considering the detection limit of the experimental system, if reemission by TMA molecules occurs, it is below 0.3% of the scintillation absorbed in the 160-188 nm range. An absorption coefficient value for xenon VUV light by TMA of 0.43 +/- 0.03 cm(-1) Torr(-1) was also obtained. These results can be especially important for experiments considering TMA as a molecular additive to Xe in large volume optical time projection chambers.  
  Address [Trindade, A. M. F.; Escada, J.; Cortez, A. F., V; Borges, F. I. G. M.; Santos, F. P.; Conde, C. A. N.] LIP Lab Instrumentacao & Fis Expt Particulas, Coimbra, Portugal, Email: Kalexandre.trindade@coimbra.lip.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000444425700003 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3730  
Permanent link to this record
 

 
Author NEXT Collaboration (Felkai, R. et al); Sorel, M.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Laing, A.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Rodriguez, J.; Simon, A.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Helium-Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs Type Journal Article
  Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 905 Issue Pages 82-90  
  Keywords Helium; Xenon; Double-beta decay; TPC; Low diffusion; Electroluminescence  
  Abstract Within the framework of xenon-based double beta decay experiments, we propose the possibility to improve the background rejection of an electroluminescent Time Projection Chamber (EL TPC) by reducing the diffusion of the drifting electrons while keeping nearly intact the energy resolution of a pure xenon EL TPC. Based on state-of-the-art microscopic simulations, a substantial addition of helium, around 10 or 15 %, may reduce drastically the transverse diffusion down to 2.5 mm/root m from the 10.5 mm/root m of pure xenon. The longitudinal diffusion remains around 4 mm/root m. Light production studies have been performed as well. They show that the relative variation in energy resolution introduced by such a change does not exceed a few percent, which leaves the energy resolution practically unchanged. The technical caveats of using photomultipliers close to an helium atmosphere are also discussed in detail.  
  Address [Adams, C.; Guenette, R.; Martin-Albo, J.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: francesc.monrabalcapilla@uta.edu  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000444425700010 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3731  
Permanent link to this record
 

 
Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging Type Journal Article
  Year 2018 Publication Physical Review Letters Abbreviated Journal Phys. Rev. Lett.  
  Volume 120 Issue 13 Pages 132504 - 6pp  
  Keywords  
  Abstract A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers.  
  Address [McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu;  
  Corporate Author Thesis  
  Publisher Amer Physical Soc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (down) 0031-9007 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000428243400005 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3538  
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