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NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N. An improved measurement of electron-ion recombination in high-pressure xenon gas 2015 Journal of Instrumentation 10 P03025 - 21pp details   doi
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness 2023 Journal of Instrumentation 18 P03016 - 21pp details   doi
NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. Description and commissioning of NEXT-MM prototype: first results from operation in a Xenon-Trimethylamine gas mixture 2014 Journal of Instrumentation 9 P03010 - 22pp details   doi
NEXT Collaboration (Alvarez, V. et al); Agramunt, J.; Ball, M.; Bayarri, J.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Gonzalez, K.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Perez, J.; Rodriguez, J.; Serra, L.; Sorel, M.; Yahlali, N. SiPMs coated with TPB: coating protocol and characterization for NEXT 2012 Journal of Instrumentation 7 P02010 details   doi
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. Background rejection in NEXT using deep neural networks 2017 Journal of Instrumentation 12 T01004 - 21pp details   doi
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