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Author ATLAS Collaboration (Aaboud, M. et al); Alvarez Piqueras, D.; Aparisi Pozo, J.A.; Bailey, A.J.; Barranco Navarro, L.; Cabrera Urban, S.; Castillo, F.L.; Castillo Gimenez, V.; Cerda Alberich, L.; Costa, M.J.; Escobar, C.; Estrada Pastor, O.; Ferrer, A.; Fiorini, L.; Fullana Torregrosa, E.; Fuster, J.; Garcia, C.; Garcia Navarro, J.E.; Gonzalez de la Hoz, S.; Higon-Rodriguez, E.; Jimenez Pena, J.; Lacasta, C.; Lozano Bahilo, J.J.; Madaffari, D.; Mamuzic, J.; Marti-Garcia, S.; Melini, D.; Miñano, M.; Mitsou, V.A.; Rodriguez Bosca, S.; Rodriguez Rodriguez, D.; Ruiz-Martinez, A.; Salt, J.; Santra, A.; Soldevila, U.; Sanchez, J.; Valero, A.; Valls Ferrer, J.A.; Vos, M.
Title Electron and photon energy calibration with the ATLAS detector using 2015-2016 LHC proton-proton collision data Type Journal Article
Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 14 Issue Pages (up) P03017 - 60pp
Keywords Calorimeter methods; Pattern recognition, cluster finding, calibration and fitting methods; Performance of High Energy Physics Detectors
Abstract This paper presents the electron and photon energy calibration obtained with the ATLAS detector using about 36 fb(-1) of LHC proton-proton collision data recorded at root s = 13 TeV in 2015 and 2016. The different calibration steps applied to the data and the optimization of the reconstruction of electron and photon energies are discussed. The absolute energy scale is set using a large sample of Z boson decays into electron-positron pairs. The systematic uncertainty in the energy scale calibration varies between 0.03% to 0.2% in most of the detector acceptance for electrons with transverse momentum close to 45 GeV. For electrons with transverse momentum of 10 GeV the typical uncertainty is 0.3% to 0.8% and it varies between 0.25% and 1% for photons with transverse momentum around 60 GeV. Validations of the energy calibration with J/psi -> e(+)e(-) decays and radiative Z boson decays are also presented.
Address [Duvnjak, D.; Jackson, P.; Oliver, J. L.; Petridis, A.; Qureshi, A.; Sharma, A. S.; White, M. J.] Univ Adelaide, Dept Phys, Adelaide, SA, Australia
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000463330900005 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3972
Permanent link to this record
 

 
Author Carrio, F.; Kim, H.Y.; Moreno, P.; Reed, R.; Sandrock, C.; Schettino, V.; Shalyugin, A.; Solans, C.; Souza, J.; Usai, G.; Valero, A.
Title Design of an FPGA-based embedded system for the ATLAS Tile Calorimeter front-end electronics test-bench Type Journal Article
Year 2014 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 9 Issue Pages (up) C03023 - 12pp
Keywords Detector control systems (detector and experiment monitoring and slow-control systems, architecture, hardware, algorithms; databases); Data acquisition concepts; Digital electronic circuits
Abstract The portable test-bench for the certification of the ATLAS tile hadronic calorimeter front-end electronics has been redesigned for the present Long Shutdown (LS1) of LHC, improving its portability and expanding its functionalities. This paper presents a new test-bench based on a Xilinx Virtex-5 FPGA that implements an embedded system using a PowerPC 440 microprocessor hard core and custom IP cores. A light Linux version runs on the PowerPC microprocessor and handles the IP cores which implement the different functionalities needed to perform the desired tests such as TTCvi emulation, G-Link decoding, ADC control and data reception.
Address [Carrio, F.; Valero, A.] Univ Valencia, CSIC, Inst Fis Corpuscular, E-46980 Paterna, Spain, Email: fernando.carrio@cern.ch
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000336123200023 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 1801
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Author Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y.
Title Mapping the depleted area of silicon diodes using a micro-focused X-ray beam Type Journal Article
Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 14 Issue Pages (up) P03024 - 14pp
Keywords Si microstrip and pad detectors; Detector design and construction technologies and materials; Particle tracking detectors (Solid-state detectors); Radiation-hard detectors
Abstract For the Phase-II Upgrade of the ATLAS detector at CERN, the current ATLAS Inner Detector will be replaced with the ATLAS Inner Tracker (ITk). The ITk will be an all-silicon detector, consisting of a pixel tracker and a strip tracker. Sensors for the ITk strip tracker are required to have a low leakage current up to bias voltages of 500V to maintain a low noise and power dissipation. In order to minimise sensor leakage currents, particularly in the high-radiation environment inside the ATLAS detector, sensors are foreseen to be operated at low temperatures and to be manufactured from wafers with a high bulk resistivity of several k Omega.cm. Simulations showed the electric field inside sensors with high bulk resistivity to extend towards the sensor edge, which could lead to increased surface currents for narrow dicing edges. In order to map the electric field inside biased silicon sensors with high bulk resistivity, three diodes from ATLAS silicon strip sensor prototype wafers were studied with a monochromatic, micro-focused X-ray beam at the Diamond Light Source (Didcot, U.K.). For all devices under investigation, the electric field inside the diode was mapped and its dependence on the applied bias voltage was studied.
Address [Poley, L.] Lawrence Berkeley Natl Lab, Cyclotron Rd, Berkeley, CA 94720 USA, Email: Anne-Luise.Poley@desy.de
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000463330900012 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3973
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Author NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N.
Title An improved measurement of electron-ion recombination in high-pressure xenon gas Type Journal Article
Year 2015 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 10 Issue Pages (up) P03025 - 21pp
Keywords Charge transport, multiplication and electroluminescence in rare gases and liquids; Double-beta decay detectors; Time projection chambers; Ionization and excitation processes
Abstract We report on results obtained with the NEXT-DEMO prototype of the NEXT-100 high-pressure xenon gas time projection chamber (TPC), filled with pure xenon gas at 10 bar pressure and exposed to an alpha decay calibration source. Compared to our previous measurements with alpha particles, an upgraded detector and improved analysis techniques have been used. We measure event-by-event correlated fluctuations between ionization and scintillation due to electronion recombination in the gas, with correlation coefficients between -0.80 and -0.56 depending on the drift field conditions. By combining the two signals, we obtain a 2.8% FWHM energy resolution for 5.49 MeV alpha particles and a measurement of the optical gain of the electroluminescent TPC. The improved energy resolution also allows us to measure the specific activity of the radon in the gas due to natural impurities. Finally, we measure the average ratio of excited to ionized atoms produced in the xenon gas by alpha particles to be 0.561 +/- 0.045, translating into an average energy to produce a primary scintillation photon of W-ex = (39.2 +/- 3.2) eV.
Address [Serra, L.; Sorel, M.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J. J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Valencia 46980, Spain, Email: luis.serra@ific.uv.es
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000357944500075 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 2307
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Author Mandic, I.; Cindro, V.; Debevc, J.; Gorisek, A.; Hiti, B.; Kramberger, G.; Skomina, P.; Zavrtanik, M.; Mikuz, M.; Vilella, E.; Zhang, C.; Powell, S.; Franks, M.; Marco-Hernandez, R.; Steininger, H.
Title Study of neutron irradiation effects in Depleted CMOS detector structures Type Journal Article
Year 2022 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 17 Issue 3 Pages (up) P03030 - 13pp
Keywords Particle tracking detectors (Solid-state detectors); Si microstrip and pad detectors; Solid state detectors
Abstract In this paper the results of Edge-TCT and I-V measurements with passive test structures made in LFoundry 150 nm HV-CMOS process on p-type substrates with different initial resistivities ranging from 0.5 to 3 k Omega cm are presented. Samples were irradiated with reactor neutrons up to a fluence of 2.10(15) n(eq)/cm(2). The depletion depth was measured with Edge-TCT. The effective space charge concentration N-eff was estimated from the dependence of the depletion depth on bias voltage and studied as a function of neutron fluence. The dependence of N-eff on fluence changes with initial acceptor concentration in agreement with other measurements with p-type silicon. A long term accelerated annealing study of N-eff and detector current up to 1280 minutes at 60 degrees C was made. It was found that N-eff and current in reverse biased detector behave as expected for irradiated silicon.
Address [Mandic, I; Cindro, V; Debevc, J.; Gorisek, A.; Hiti, B.; Kramberger, G.; Skomina, P.; Zavrtanik, M.; Mikuz, M.] Jozef Stefan Inst, Jamova 39, Ljubljana, Slovenia, Email: igor.mandic@ijs.si
Corporate Author Thesis
Publisher IOP Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000784713600004 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 5208
Permanent link to this record