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Author NEXT Collaboration (Renner, J. et al); Kekic, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Lopez-March, N.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Energy calibration of the NEXT-White detector with 1% resolution near Q(beta beta) of Xe-136 Type Journal Article
  Year 2019 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 10 Issue 10 Pages (up) 230 - 13pp  
  Keywords Dark Matter and Double Beta Decay (experiments)  
  Abstract Excellent energy resolution is one of the primary advantages of electroluminescent high-pressure xenon TPCs. These detectors are promising tools in searching for rare physics events, such as neutrinoless double-beta decay (beta beta 0 nu), which require precise energy measurements. Using the NEXT-White detector, developed by the NEXT (Neutrino Experiment with a Xenon TPC) collaboration, we show for the first time that an energy resolution of 1% FWHM can be achieved at 2.6 MeV, establishing the present technology as the one with the best energy resolution of all xenon detectors for beta beta 0 nu searches.  
  Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: josren@uv.es  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000492984100001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4188  
Permanent link to this record
 

 
Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
  Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 773 Issue Pages (up) 663-671  
  Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon  
  Abstract Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.  
  Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000413294200099 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3342  
Permanent link to this record
 

 
Author NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Background rejection in NEXT using deep neural networks Type Journal Article
  Year 2017 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 12 Issue Pages (up) T01004 - 21pp  
  Keywords Analysis and statistical methods; Pattern recognition; cluster finding; calibration and fitting methods; Double-beta decay detectors; Time projection chambers  
  Abstract We investigate the potential of using deep learning techniques to reject background events in searches for neutrinoless double beta decay with high pressure xenon time projection chambers capable of detailed track reconstruction. The differences in the topological signatures of background and signal events can be learned by deep neural networks via training over many thousands of events. These networks can then be used to classify further events as signal or background, providing an additional background rejection factor at an acceptable loss of efficiency. The networks trained in this study performed better than previous methods developed based on the use of the same topological signatures by a factor of 1.2 to 1.6, and there is potential for further improvement.  
  Address [Renner, J.; Munoz Vidal, J.; Benlloch-Rodriguez, J. M.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Carrion, J. V.; Cervera, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: jrenner@ific.uv.es  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000395770200004 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2995  
Permanent link to this record
 

 
Author Nygren, D.R.; Jones, B.J.P.; Lopez-March, N.; Mei, Y.; Psihas, F.; Renner, J. url  doi
openurl 
  Title Neutrinoless double beta decay with 82SeF6 and direct ion imaging Type Journal Article
  Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 13 Issue Pages (up) P03015 - 23pp  
  Keywords Charge transport and multiplication in gas; Gaseous detectors; Ion identification systems; Ionization and excitation processes  
  Abstract We present a new neutrinoless double beta decay concept: the high pressure selenium hexafluoride gas time projection chamber. A promising new detection technique is outlined which combines techniques pioneered in high pressure xenon gas, such as topological discrimination, with the high Q-value afforded by the double beta decay isotope Se-82. The lack of free electrons in SeF6 mandates the use of an ion TPC. The microphysics of ion production and drift, which have many nuances, are explored. Background estimates are presented, suggesting that such a detector may achieve background indices of better than 1 count per ton per year in the region of interest at the 100 kg scale, and still better at the ton-scale.  
  Address [Nygren, D. R.; Jones, B. J. P.; Lopez-March, N.; Psihas, F.] Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA, Email: ben.jones@uta.edu  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000428146300005 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3541  
Permanent link to this record
 

 
Author NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N. url  doi
openurl 
  Title An improved measurement of electron-ion recombination in high-pressure xenon gas Type Journal Article
  Year 2015 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 10 Issue Pages (up) P03025 - 21pp  
  Keywords Charge transport, multiplication and electroluminescence in rare gases and liquids; Double-beta decay detectors; Time projection chambers; Ionization and excitation processes  
  Abstract We report on results obtained with the NEXT-DEMO prototype of the NEXT-100 high-pressure xenon gas time projection chamber (TPC), filled with pure xenon gas at 10 bar pressure and exposed to an alpha decay calibration source. Compared to our previous measurements with alpha particles, an upgraded detector and improved analysis techniques have been used. We measure event-by-event correlated fluctuations between ionization and scintillation due to electronion recombination in the gas, with correlation coefficients between -0.80 and -0.56 depending on the drift field conditions. By combining the two signals, we obtain a 2.8% FWHM energy resolution for 5.49 MeV alpha particles and a measurement of the optical gain of the electroluminescent TPC. The improved energy resolution also allows us to measure the specific activity of the radon in the gas due to natural impurities. Finally, we measure the average ratio of excited to ionized atoms produced in the xenon gas by alpha particles to be 0.561 +/- 0.045, translating into an average energy to produce a primary scintillation photon of W-ex = (39.2 +/- 3.2) eV.  
  Address [Serra, L.; Sorel, M.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J. J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Valencia 46980, Spain, Email: luis.serra@ific.uv.es  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000357944500075 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2307  
Permanent link to this record
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