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Author Nygren, D.R.; Jones, B.J.P.; Lopez-March, N.; Mei, Y.; Psihas, F.; Renner, J.
Title Neutrinoless double beta decay with 82SeF6 and direct ion imaging Type Journal Article
Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 13 Issue Pages (up) P03015 - 23pp
Keywords Charge transport and multiplication in gas; Gaseous detectors; Ion identification systems; Ionization and excitation processes
Abstract We present a new neutrinoless double beta decay concept: the high pressure selenium hexafluoride gas time projection chamber. A promising new detection technique is outlined which combines techniques pioneered in high pressure xenon gas, such as topological discrimination, with the high Q-value afforded by the double beta decay isotope Se-82. The lack of free electrons in SeF6 mandates the use of an ion TPC. The microphysics of ion production and drift, which have many nuances, are explored. Background estimates are presented, suggesting that such a detector may achieve background indices of better than 1 count per ton per year in the region of interest at the 100 kg scale, and still better at the ton-scale.
Address [Nygren, D. R.; Jones, B. J. P.; Lopez-March, N.; Psihas, F.] Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA, Email: ben.jones@uta.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000428146300005 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3541
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Author NEXT Collaboration (Simon, A. et al); Felkai, R.; Martinez-Lema, G.; Sorel, M.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo Luque, C.; Torrent, J.; Yahlali, N.
Title Electron drift properties in high pressure gaseous xenon Type Journal Article
Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 13 Issue Pages (up) P07013 - 23pp
Keywords Charge transport and multiplication in gas; Charge transport, multiplication and electroluminescence in rare gases and liquids; Double-beta decay detectors; Gaseous imaging and tracking detectors
Abstract Gaseous time projection chambers (TPC) are a very attractive detector technology for particle tracking. Characterization of both drift velocity and diffusion is of great importance to correctly assess their tracking capabilities. NEXT-White is a High Pressure Xenon gas TPC with electroluminescent amplification, a 1:2 scale model of the future NEXT-100 detector, which will be dedicated to neutrinoless double beta decay searches. NEXT-White has been operating at Canfranc Underground Laboratory (LSC) since December 2016. The drift parameters have been measured using Kr-83(m) for a range of reduced drift fields at two different pressure regimes, namely 7.2 bar and 9.1 bar. The results have been compared with Magboltz simulations. Agreement at the 5% level or better has been found for drift velocity, longitudinal diffusion and transverse diffusion.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: ander@post.bgu.ac.il
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000439125700006 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3671
Permanent link to this record
 

 
Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Electron drift and longitudinal diffusion in high pressure xenon-helium gas mixtures Type Journal Article
Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 14 Issue Pages (up) P08009 - 19pp
Keywords Charge transport and multiplication in gas; Gaseous imaging and tracking detectors
Abstract We report new measurements of the drift velocity and longitudinal diffusion coefficients of electrons in pure xenon gas and in xenon-helium gas mixtures at 1-9 bar and electric field strengths of 50-300 V/cm. In pure xenon we find excellent agreement with world data at all E/P, for both drift velocity and diffusion coefficients. However, a larger value of the longitudinal diffusion coefficient than theoretical predictions is found at low E/P in pure xenon, below the range of reduced fields usually probed by TPC experiments. A similar effect is observed in xenon-helium gas mixtures at somewhat larger E/P. Drift velocities in xenon-helium mixtures are found to be theoretically well predicted. Although longitudinal diffusion in xenon-helium mixtures is found to be larger than anticipated, extrapolation based on the measured longitudinal diffusion coefficients suggest that the use of helium additives to reduce transverse diffusion in xenon gas remains a promising prospect.
Address [McDonald, A. D.; Woodruff, K.; Al Atoum, B.; Jones, B. J. P.; Laing, A.; Nygren, D. R.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000482373600006 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4118
Permanent link to this record