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Author (up) NEXT Collaboration (Fernandes, A.F.M. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield Type Journal Article
Year 2020 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 04 Issue 4 Pages 034 - 18pp
Keywords Particle correlations and fluctuations; Photon production; Dark Matter and Double Beta Decay (experiments); Rare decay
Abstract High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: cristinam@uc.pt
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000525257400001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4366
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Author (up) NEXT Collaboration (Ferrario, P. et al); Benlloch-Rodriguez, J.M.; Kekic, M.; Renner, J.; Uson, A.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Yahlali, N.
Title Demonstration of the event identification capabilities of the NEXT-White detector Type Journal Article
Year 2019 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 10 Issue 10 Pages 052 - 20pp
Keywords Dark Matter and Double Beta Decay (experiments)
Abstract In experiments searching for neutrinoless double-beta decay, the possibility of identifying the two emitted electrons is a powerful tool in rejecting background events and therefore improving the overall sensitivity of the experiment. In this paper we present the first measurement of the efficiency of a cut based on the different event signatures of double and single electron tracks, using the data of the NEXT-White detector, the first detector of the NEXT experiment operating underground. Using a Th-228 calibration source to produce signal-like and background-like events with energies near 1.6 MeV, a signal efficiency of 71.6 +/- 1.5(stat) +/- 0.3(sys) % for a background acceptance of 20.6 +/- 0.4(stat) +/- 0.3(sys)% is found, in good agreement with Monte Carlo simulations. An extrapolation to the energy region of the neutrinoless double beta decay by means of Monte Carlo simulations is also carried out, and the results obtained show an improvement in background rejection over those obtained at lower energies.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: paola.ferrario@dipc.org
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000509259700001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4260
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Author (up) NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air Type Journal Article
Year 2020 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 15 Issue 11 Pages P11031 - 16pp
Keywords Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC)
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000595650800024 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4633
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Author (up) NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.
Title Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness Type Journal Article
Year 2023 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 18 Issue 3 Pages P03016 - 21pp
Keywords Materials for gaseous detectors; Particle tracking detectors (Gaseous detectors); Time projection chambers
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA, Email: adam.fahs@mail.utoronto.ca
Corporate Author Thesis
Publisher IOP Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000971136300003 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 5526
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Author (up) NEXT Collaboration (Haefner, J. et al); Carcel, S.; Carrion, J.V.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A.
Title Demonstration of event position reconstruction based on diffusion in the NEXT-white detector Type Journal Article
Year 2024 Publication European Physical Journal C Abbreviated Journal Eur. Phys. J. C
Volume 84 Issue 5 Pages 518 - 13pp
Keywords
Abstract Noble element time projection chambers are a leading technology for rare event detection in physics, such as for dark matter and neutrinoless double beta decay searches. Time projection chambers typically assign event position in the drift direction using the relative timing of prompt scintillation and delayed charge collection signals, allowing for reconstruction of an absolute position in the drift direction. In this paper, alternate methods for assigning event drift distance via quantification of electron diffusion in a pure high pressure xenon gas time projection chamber are explored. Data from the NEXT-White detector demonstrate the ability to achieve good position assignment accuracy for both high- and low-energy events. Using point-like energy deposits from Kr-83m calibration electron captures (E similar to 45 keV), the position of origin of low-energy events is determined to 2 cm precision with bias <1 mm. A convolutional neural network approach is then used to quantify diffusion for longer tracks (E >= 1.5 MeV), from radiogenic electrons, yielding a precision of 3 cm on the event barycenter. The precision achieved with these methods indicates the feasibility energy calibrations of better than 1% FWHM at Q(beta beta) in pure xenon, as well as the potential for event fiducialization in large future detectors using an alternate method that does not rely on primary scintillation.
Address [Haefner, J.; Contreras, T.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: karen.navarro@uta.edu
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1434-6044 ISBN Medium
Area Expedition Conference
Notes WOS:001228898800001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 6138
Permanent link to this record