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Author (up) NEXT Collaboration (Ferrario, P. et al); Laing, A.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title First proof of topological signature in the high pressure xenon gas TPC with electroluminescence amplification for the NEXT experiment Type Journal Article
  Year 2016 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 01 Issue 1 Pages 104 - 18pp  
  Keywords Dark Matter; Double Beta Decay  
  Abstract The NEXT experiment aims to observe the neutrinoless double beta decay of Xe-136 in a high-pressure xenon gas TPC using electroluminescence (EL) to amplify the signal from ionization. One of the main advantages of this technology is the possibility to reconstruct the topology of events with energies close to Q(beta beta). This paper presents the first demonstration that the topology provides extra handles to reject background events using data obtained with the NEXT-DEMO prototype. Single electrons resulting from the interactions of Na-22 1275 keV gammas and electron-positron pairs produced by conversions of gammas from the Th-228 decay chain were used to represent the background and the signal in a double beta decay. These data were used to develop algorithms for the reconstruction of tracks and the identification of the energy deposited at the end-points, providing an extra background rejection factor of 24.3 +/- 1.4 (stat.)%, while maintaining an efficiency of 66.7 +/- 1.% for signal events.  
  Address [Ferrario, P.; Laing, A.; Lopez-March, N.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Jose Beltran 2, Valencia 46980, Spain, Email: paola.ferrario@ific.uv.es  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000370438900001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2560  
Permanent link to this record
 

 
Author (up) NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air Type Journal Article
  Year 2020 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 15 Issue 11 Pages P11031 - 16pp  
  Keywords Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC)  
  Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.  
  Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000595650800024 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4633  
Permanent link to this record
 

 
Author (up) NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. url  doi
openurl 
  Title Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness Type Journal Article
  Year 2023 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 18 Issue 3 Pages P03016 - 21pp  
  Keywords Materials for gaseous detectors; Particle tracking detectors (Gaseous detectors); Time projection chambers  
  Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.  
  Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA, Email: adam.fahs@mail.utoronto.ca  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000971136300003 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5526  
Permanent link to this record
 

 
Author (up) NEXT Collaboration (Henriques, C.A.O. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Simon, A.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title Electroluminescence TPCs at the thermal diffusion limit Type Journal Article
  Year 2019 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.  
  Volume 01 Issue 1 Pages 027 - 23pp  
  Keywords Dark Matter and Double Beta Decay (experiments); Photon production; Particle correlations and fluctuations; Rare decay  
  Abstract The NEXT experiment aims at searching for the hypothetical neutrinoless double-beta decay from the Xe-136 isotope using a high-purity xenon TPC. Efficient discrimination of the events through pattern recognition of the topology of primary ionisation tracks is a major requirement for the experiment. However, it is limited by the diffusion of electrons. It is known that the addition of a small fraction of a molecular gas to xenon reduces electron diffusion. On the other hand, the electroluminescence (EL) yield drops and the achievable energy resolution may be compromised. We have studied the effect of adding several molecular gases to xenon (CO2, CH4 and CF4) on the EL yield and energy resolution obtained in a small prototype of driftless gas proportional scintillation counter. We have compared our results on the scintillation characteristics (EL yield and energy resolution) with a microscopic simulation, obtaining the diffusion coefficients in those conditions as well. Accordingly, electron diffusion may be reduced from about 10 for pure xenon down to 2.5 using additive concentrations of about 0.05%, 0.2% and 0.02% for CO2, CH4 and CF4, respectively. Our results show that CF4 admixtures present the highest EL yield in those conditions, but very poor energy resolution as a result of huge fluctuations observed in the EL formation. CH4 presents the best energy resolution despite the EL yield being the lowest. The results obtained with xenon admixtures are extrapolated to the operational conditions of the NEXT-100 TPC. CO2 and CH4 show potential as molecular additives in a large xenon TPC. While CO2 has some operational constraints, making it difficult to be used in a large TPC, CH4 shows the best performance and stability as molecular additive to be used in the NEXT-100 TPC, with an extrapolated energy resolution of 0.4% at 2.45 MeV for concentrations below 0.4%, which is only slightly worse than the one obtained for pure xenon. We demonstrate the possibility to have an electroluminescence TPC operating very close to the thermal diffusion limit without jeopardizing the TPC performance, if CO2 or CH4 are chosen as additives.  
  Address [Henriques, C. A. O.; Monteiro, C. M. B.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, A. F. M.; Fernandes, L. M. P.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: pancho@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1029-8479 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000455157300002 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3873  
Permanent link to this record
 

 
Author (up) NEXT Collaboration (Henriques, C.A.O. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. url  doi
openurl 
  Title Neutral Bremsstrahlung Emission in Xenon Unveiled Type Journal Article
  Year 2022 Publication Physical Review X Abbreviated Journal Phys. Rev. X  
  Volume 12 Issue 2 Pages 021005 - 23pp  
  Keywords  
  Abstract We present evidence of non-excimer-based secondary scintillation in gaseous xenon, obtained using both the NEXT-White time projection chamber (TPC) and a dedicated setup. Detailed comparison with first-principle calculations allows us to assign this scintillation mechanism to neutral bremsstrahlung (NBrS), a process that is postulated to exist in xenon that has been largely overlooked. For photon emission below 1000 nm, the NBrS yield increases from about 10(-2) photon/e(-) cm(-1) bar(-1) at pressure-reduced electric field values of 50 V cm(-1) bar(-1) to above 3 x 10(-1) photon/e(-) cm(-1) bar(-1) at 500 V cm(-1) bar(-1). Above 1.5 kV cm(-1) bar(-1), values that are typically employed for electroluminescence, it is estimated that NBrS is present with an intensity around 1 photon/e(-) cm(-1) bar(-1), which is about 2 orders of magnitude lower than conventional, excimer-based electroluminescence. Despite being fainter than its excimeric counterpart, our calculations reveal that NBrS causes luminous backgrounds that can interfere, in either gas or liquid phase, with the ability to distinguish and/or to precisely measure low primary-scintillation signals (S1). In particular, we show this to be the case in the "buffer region, where keeping the electric field below the electroluminescence threshold does not suffice to extinguish secondary scintillation. The electric field leakage in this region should be mitigated to avoid intolerable levels of NBrS emission. Furthermore, we show that this new source of light emission opens up a viable path toward obtaining S2 signals for discrimination purposes in future single-phase liquid TPCs for neutrino and dark matter physics, with estimated yields up to 20-50 photons/e(-) cm(-1).  
  Address [Henriques, C. A. O.; Teixeira, J. M. R.; Monteiro, C. M. B.; Fernandes, A. F. M.; Fernandes, L. M. P.; Freitas, E. D. C.; dos Santos, J. M. F.] Univ Coimbra, Dept Phys, ILIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: henriques@uc.pt;  
  Corporate Author Thesis  
  Publisher Amer Physical Soc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2160-3308 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000792590100001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5220  
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