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Author (up) NEXT Collaboration (Ferrario, P. et al); Laing, A.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.
Title First proof of topological signature in the high pressure xenon gas TPC with electroluminescence amplification for the NEXT experiment Type Journal Article
Year 2016 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 01 Issue 1 Pages 104 - 18pp
Keywords Dark Matter; Double Beta Decay
Abstract The NEXT experiment aims to observe the neutrinoless double beta decay of Xe-136 in a high-pressure xenon gas TPC using electroluminescence (EL) to amplify the signal from ionization. One of the main advantages of this technology is the possibility to reconstruct the topology of events with energies close to Q(beta beta). This paper presents the first demonstration that the topology provides extra handles to reject background events using data obtained with the NEXT-DEMO prototype. Single electrons resulting from the interactions of Na-22 1275 keV gammas and electron-positron pairs produced by conversions of gammas from the Th-228 decay chain were used to represent the background and the signal in a double beta decay. These data were used to develop algorithms for the reconstruction of tracks and the identification of the energy deposited at the end-points, providing an extra background rejection factor of 24.3 +/- 1.4 (stat.)%, while maintaining an efficiency of 66.7 +/- 1.% for signal events.
Address [Ferrario, P.; Laing, A.; Lopez-March, N.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Jose Beltran 2, Valencia 46980, Spain, Email: paola.ferrario@ific.uv.es
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000370438900001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 2560
Permanent link to this record
 
 
Author (up) NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N.
Title Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air Type Journal Article
Year 2020 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 15 Issue 11 Pages P11031 - 16pp
Keywords Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC)
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000595650800024 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 4633
Permanent link to this record
 
 
Author (up) NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.
Title Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness Type Journal Article
Year 2023 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 18 Issue 3 Pages P03016 - 21pp
Keywords Materials for gaseous detectors; Particle tracking detectors (Gaseous detectors); Time projection chambers
Abstract Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.
Address [Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA, Email: adam.fahs@mail.utoronto.ca
Corporate Author Thesis
Publisher IOP Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000971136300003 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 5526
Permanent link to this record
 
 
Author (up) NEXT Collaboration (Haefner, J. et al); Carcel, S.; Carrion, J.V.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A.
Title Demonstration of event position reconstruction based on diffusion in the NEXT-white detector Type Journal Article
Year 2024 Publication European Physical Journal C Abbreviated Journal Eur. Phys. J. C
Volume 84 Issue 5 Pages 518 - 13pp
Keywords
Abstract Noble element time projection chambers are a leading technology for rare event detection in physics, such as for dark matter and neutrinoless double beta decay searches. Time projection chambers typically assign event position in the drift direction using the relative timing of prompt scintillation and delayed charge collection signals, allowing for reconstruction of an absolute position in the drift direction. In this paper, alternate methods for assigning event drift distance via quantification of electron diffusion in a pure high pressure xenon gas time projection chamber are explored. Data from the NEXT-White detector demonstrate the ability to achieve good position assignment accuracy for both high- and low-energy events. Using point-like energy deposits from Kr-83m calibration electron captures (E similar to 45 keV), the position of origin of low-energy events is determined to 2 cm precision with bias <1 mm. A convolutional neural network approach is then used to quantify diffusion for longer tracks (E >= 1.5 MeV), from radiogenic electrons, yielding a precision of 3 cm on the event barycenter. The precision achieved with these methods indicates the feasibility energy calibrations of better than 1% FWHM at Q(beta beta) in pure xenon, as well as the potential for event fiducialization in large future detectors using an alternate method that does not rely on primary scintillation.
Address [Haefner, J.; Contreras, T.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: karen.navarro@uta.edu
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1434-6044 ISBN Medium
Area Expedition Conference
Notes WOS:001228898800001 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 6138
Permanent link to this record
 
 
Author (up) NEXT Collaboration (Henriques, C.A.O. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Simon, A.; Sorel, M.; Yahlali, N.
Title Electroluminescence TPCs at the thermal diffusion limit Type Journal Article
Year 2019 Publication Journal of High Energy Physics Abbreviated Journal J. High Energy Phys.
Volume 01 Issue 1 Pages 027 - 23pp
Keywords Dark Matter and Double Beta Decay (experiments); Photon production; Particle correlations and fluctuations; Rare decay
Abstract The NEXT experiment aims at searching for the hypothetical neutrinoless double-beta decay from the Xe-136 isotope using a high-purity xenon TPC. Efficient discrimination of the events through pattern recognition of the topology of primary ionisation tracks is a major requirement for the experiment. However, it is limited by the diffusion of electrons. It is known that the addition of a small fraction of a molecular gas to xenon reduces electron diffusion. On the other hand, the electroluminescence (EL) yield drops and the achievable energy resolution may be compromised. We have studied the effect of adding several molecular gases to xenon (CO2, CH4 and CF4) on the EL yield and energy resolution obtained in a small prototype of driftless gas proportional scintillation counter. We have compared our results on the scintillation characteristics (EL yield and energy resolution) with a microscopic simulation, obtaining the diffusion coefficients in those conditions as well. Accordingly, electron diffusion may be reduced from about 10 for pure xenon down to 2.5 using additive concentrations of about 0.05%, 0.2% and 0.02% for CO2, CH4 and CF4, respectively. Our results show that CF4 admixtures present the highest EL yield in those conditions, but very poor energy resolution as a result of huge fluctuations observed in the EL formation. CH4 presents the best energy resolution despite the EL yield being the lowest. The results obtained with xenon admixtures are extrapolated to the operational conditions of the NEXT-100 TPC. CO2 and CH4 show potential as molecular additives in a large xenon TPC. While CO2 has some operational constraints, making it difficult to be used in a large TPC, CH4 shows the best performance and stability as molecular additive to be used in the NEXT-100 TPC, with an extrapolated energy resolution of 0.4% at 2.45 MeV for concentrations below 0.4%, which is only slightly worse than the one obtained for pure xenon. We demonstrate the possibility to have an electroluminescence TPC operating very close to the thermal diffusion limit without jeopardizing the TPC performance, if CO2 or CH4 are chosen as additives.
Address [Henriques, C. A. O.; Monteiro, C. M. B.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, A. F. M.; Fernandes, L. M. P.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: pancho@gian.fis.uc.pt
Corporate Author Thesis
Publisher Springer Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1029-8479 ISBN Medium
Area Expedition Conference
Notes WOS:000455157300002 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3873
Permanent link to this record