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NEXT Collaboration (Ferrario, P. et al); Laing, A.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
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Title |
First proof of topological signature in the high pressure xenon gas TPC with electroluminescence amplification for the NEXT experiment |
Type |
Journal Article |
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Year |
2016 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
01 |
Issue |
1 |
Pages |
104 - 18pp |
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Keywords |
Dark Matter; Double Beta Decay |
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Abstract |
The NEXT experiment aims to observe the neutrinoless double beta decay of Xe-136 in a high-pressure xenon gas TPC using electroluminescence (EL) to amplify the signal from ionization. One of the main advantages of this technology is the possibility to reconstruct the topology of events with energies close to Q(beta beta). This paper presents the first demonstration that the topology provides extra handles to reject background events using data obtained with the NEXT-DEMO prototype. Single electrons resulting from the interactions of Na-22 1275 keV gammas and electron-positron pairs produced by conversions of gammas from the Th-228 decay chain were used to represent the background and the signal in a double beta decay. These data were used to develop algorithms for the reconstruction of tracks and the identification of the energy deposited at the end-points, providing an extra background rejection factor of 24.3 +/- 1.4 (stat.)%, while maintaining an efficiency of 66.7 +/- 1.% for signal events. |
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Address |
[Ferrario, P.; Laing, A.; Lopez-March, N.; Gomez-Cadenas, J. J.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] CSIC, Inst Fis Corpuscular IFIC, Jose Beltran 2, Valencia 46980, Spain, Email: paola.ferrario@ific.uv.es |
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Publisher |
Springer |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000370438900001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
2560 |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
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Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
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Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
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Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
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Expedition |
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Conference |
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Notes |
WOS:000595650800024 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4633 |
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Author |
NEXT Collaboration (Gomez-Cadenas, J.J. et al); Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
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Title |
Present Status and Future Perspectives of the NEXT Experiment |
Type |
Journal Article |
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Year |
2014 |
Publication |
Advances in High Energy Physics |
Abbreviated Journal |
Adv. High. Energy Phys. |
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Volume |
2014 |
Issue |
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Pages |
907067 - 22pp |
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Keywords |
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Abstract |
NEXT is an experiment dedicated to neutrinoless double beta decay searches in xenon. The detector is a TPC, holding 100 kg of high-pressure xenon enriched in the Xe-136 isotope. It is under construction in the Laboratorio Subterraneo de Canfranc in Spain, and it will begin operations in 2015. The NEXT detector concept provides an energy resolutionbetter than 1% FWHM and a topological signal that can be used to reduce the background. Furthermore, the NEXT technology can be extrapolated to a 1 ton-scale experiment. |
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Address |
[Gomez Cadenas, J. J.; Alvarez, V.; Carcel, S.; Cervera, A.; Diaz, J.; Ferrario, P.; Gil, A.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Munoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.] Univ Valencia, CSIC, Inst Fis Corpuscular IFIC, Valencia 46980, Spain, Email: paola.ferrario@ific.uv.es |
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Corporate Author |
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Thesis |
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Publisher |
Hindawi Publishing Corporation |
Place of Publication |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1687-7357 |
ISBN |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000333620700001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
1745 |
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Author |
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
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Title |
Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness |
Type |
Journal Article |
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Year |
2023 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
18 |
Issue |
3 |
Pages |
P03016 - 21pp |
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Keywords |
Materials for gaseous detectors; Particle tracking detectors (Gaseous detectors); Time projection chambers |
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Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA, Email: adam.fahs@mail.utoronto.ca |
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Corporate Author |
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Publisher |
IOP Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000971136300003 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
5526 |
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| Permanent link to this record |
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Author |
NEXT Collaboration (Haefner, J. et al); Carcel, S.; Carrion, J.V.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A. |
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Title |
Demonstration of event position reconstruction based on diffusion in the NEXT-white detector |
Type |
Journal Article |
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Year |
2024 |
Publication |
European Physical Journal C |
Abbreviated Journal |
Eur. Phys. J. C |
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Volume |
84 |
Issue |
5 |
Pages |
518 - 13pp |
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Keywords |
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Abstract |
Noble element time projection chambers are a leading technology for rare event detection in physics, such as for dark matter and neutrinoless double beta decay searches. Time projection chambers typically assign event position in the drift direction using the relative timing of prompt scintillation and delayed charge collection signals, allowing for reconstruction of an absolute position in the drift direction. In this paper, alternate methods for assigning event drift distance via quantification of electron diffusion in a pure high pressure xenon gas time projection chamber are explored. Data from the NEXT-White detector demonstrate the ability to achieve good position assignment accuracy for both high- and low-energy events. Using point-like energy deposits from Kr-83m calibration electron captures (E similar to 45 keV), the position of origin of low-energy events is determined to 2 cm precision with bias <1 mm. A convolutional neural network approach is then used to quantify diffusion for longer tracks (E >= 1.5 MeV), from radiogenic electrons, yielding a precision of 3 cm on the event barycenter. The precision achieved with these methods indicates the feasibility energy calibrations of better than 1% FWHM at Q(beta beta) in pure xenon, as well as the potential for event fiducialization in large future detectors using an alternate method that does not rely on primary scintillation. |
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Address |
[Haefner, J.; Contreras, T.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: karen.navarro@uta.edu |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1434-6044 |
ISBN |
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Expedition |
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Conference |
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Notes |
WOS:001228898800001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
6138 |
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