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NEXT Collaboration(Felkai, R. et al), Sorel, M., Lopez-March, N., Gomez-Cadenas, J. J., Alvarez, V., Benlloch-Rodriguez, J. M., et al. (2018). Helium-Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs. Nucl. Instrum. Methods Phys. Res. A, 905, 82–90.
Abstract: Within the framework of xenon-based double beta decay experiments, we propose the possibility to improve the background rejection of an electroluminescent Time Projection Chamber (EL TPC) by reducing the diffusion of the drifting electrons while keeping nearly intact the energy resolution of a pure xenon EL TPC. Based on state-of-the-art microscopic simulations, a substantial addition of helium, around 10 or 15 %, may reduce drastically the transverse diffusion down to 2.5 mm/root m from the 10.5 mm/root m of pure xenon. The longitudinal diffusion remains around 4 mm/root m. Light production studies have been performed as well. They show that the relative variation in energy resolution introduced by such a change does not exceed a few percent, which leaves the energy resolution practically unchanged. The technical caveats of using photomultipliers close to an helium atmosphere are also discussed in detail.
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NEXT Collaboration(Fernandes, A. F. M. et al), Alvarez, V., Benlloch-Rodriguez, J. M., Carcel, S., Carrion, J. V., Diaz, J., et al. (2020). Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield. J. High Energy Phys., 04(4), 034–18pp.
Abstract: High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures.
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NEXT Collaboration(Ferrario, P. et al), Benlloch-Rodriguez, J. M., Kekic, M., Renner, J., Uson, A., Alvarez, V., et al. (2019). Demonstration of the event identification capabilities of the NEXT-White detector. J. High Energy Phys., 10(10), 052–20pp.
Abstract: In experiments searching for neutrinoless double-beta decay, the possibility of identifying the two emitted electrons is a powerful tool in rejecting background events and therefore improving the overall sensitivity of the experiment. In this paper we present the first measurement of the efficiency of a cut based on the different event signatures of double and single electron tracks, using the data of the NEXT-White detector, the first detector of the NEXT experiment operating underground. Using a Th-228 calibration source to produce signal-like and background-like events with energies near 1.6 MeV, a signal efficiency of 71.6 +/- 1.5(stat) +/- 0.3(sys) % for a background acceptance of 20.6 +/- 0.4(stat) +/- 0.3(sys)% is found, in good agreement with Monte Carlo simulations. An extrapolation to the energy region of the neutrinoless double beta decay by means of Monte Carlo simulations is also carried out, and the results obtained show an improvement in background rejection over those obtained at lower energies.
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NEXT Collaboration(Ferrario, P. et al), Laing, A., Lopez-March, N., Gomez-Cadenas, J. J., Alvarez, V., Carcel, S., et al. (2016). First proof of topological signature in the high pressure xenon gas TPC with electroluminescence amplification for the NEXT experiment. J. High Energy Phys., 01(1), 104–18pp.
Abstract: The NEXT experiment aims to observe the neutrinoless double beta decay of Xe-136 in a high-pressure xenon gas TPC using electroluminescence (EL) to amplify the signal from ionization. One of the main advantages of this technology is the possibility to reconstruct the topology of events with energies close to Q(beta beta). This paper presents the first demonstration that the topology provides extra handles to reject background events using data obtained with the NEXT-DEMO prototype. Single electrons resulting from the interactions of Na-22 1275 keV gammas and electron-positron pairs produced by conversions of gammas from the Th-228 decay chain were used to represent the background and the signal in a double beta decay. These data were used to develop algorithms for the reconstruction of tracks and the identification of the energy deposited at the end-points, providing an extra background rejection factor of 24.3 +/- 1.4 (stat.)%, while maintaining an efficiency of 66.7 +/- 1.% for signal events.
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NEXT Collaboration(Ghosh, S. et al), Martin-Albo, J., Carcel, S., Carrion, J. V., Diaz, J., Felkai, R., et al. (2020). Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air. J. Instrum., 15(11), P11031–16pp.
Abstract: Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
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