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Domingo-Pardo, C., Goel, N., Engert, T., Gerl, J., Kojouharov, I., Schaffner, H., et al. (2011). A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors. Nucl. Instrum. Methods Phys. Res. A, 643(1), 79–88.
Abstract: A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.
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Goel, N., Domingo-Pardo, C., Habermann, T., Ameil, F., Engert, T., Gerl, J., et al. (2013). Characterisation of a symmetric AGATA detector using the gamma-ray imaging scanning technique. Nucl. Instrum. Methods Phys. Res. A, 700, 10–21.
Abstract: The imaging scanning technique for the characterisation of large volume, highly segmented, HPGe detectors is demonstrated by comparing the measured spatial response of a symmetric AGATA crystal versus the theoretical calculations obtained with the Multi-Geometry Simulation (MGS) code. The signal rise-times measured as a function of the gamma-ray interaction positions, in both coaxial and planar regions of the detection volume, are presented and confronted with the expected behaviour obtained via MGS. The transition in charge carrier transport behaviour as a function of the depth is studied for the region of the complex electric field. In general, a fairly good agreement between theory and experiment is obtained. Only systematic deviations between simulation and measurement are observed in the critical front part of the AGATA detector. They may be ascribed to a non-linear impurity concentration profile of the germanium crystal.
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