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Author Freitas, E.D.C.; Monteiro, C.M.B.; Ball, M.; Gomez-Cadenas, J.J.; Lopes, J.A.M.; Lux, T.; Sanchez, F.; dos Santos, J.M.F. doi  openurl
  Title Secondary scintillation yield in high-pressure xenon gas for neutrinoless double beta decay (0 nu beta beta) search Type Journal Article
  Year 2010 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 684 Issue 4-5 Pages 205-210  
  Keywords Neutrino; Neutrinoless double-beta decay; Secondary scintillation; Xenon; High-pressure  
  Abstract The search for neutrinoless double beta decay (0 nu beta beta) is an important topic in contemporary physics with many active experiments. New projects are planning to use high-pressure xenon gas as both source and detection medium. The secondary scintillation processes available in noble gases permit large amplification with negligible statistical fluctuations, offering the prospect of energy resolution approaching the Fano factor limit. This Letter reports results for xenon secondary scintillation yield, at room temperature, as a function of electric field in the gas scintillation gap for pressures ranging from 2 to 10 bar. A Large Area Avalanche Photodiode (LAAPD) collected the VUV secondary scintillation produced in the gas. X-rays directly absorbed in the LAAPD are used as a reference for determining the number of charge carriers produced by the scintillation pulse and, hence, the number of photons impinging the LAAPD. The number of photons produced per drifting electron and per kilovolt, the so-called scintillation amplification parameter, displays a small increase with pressure, ranging from 141 +/- 6 at 2 bar to 170 +/- 10 at 8 bar. In our setup, this Parameter does not increase above 8 bar due to nonnegligible electron attachment. The results are in good agreement with those presented in the literature in the 1 to 3 bar range. The increase of the scintillation amplification parameter with pressure for high gas densities has been also observed in former work at cryogenic temperatures.  
  Address [Freitas, E. D. C.; Monteiro, C. M. B.; Lopes, J. A. M.; dos Santos, J. M. F.] Univ Coimbra, GIAN CI, Dept Fis, P-3004516 Coimbra, Portugal, Email: jmf@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes ISI:000275009600006 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ elepoucu @ Serial 487  
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Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. url  doi
openurl 
  Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
  Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 773 Issue Pages 663-671  
  Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon  
  Abstract Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.  
  Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000413294200099 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3342  
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