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Author (up) LHCb Collaboration (Aaij, R. et al); Jaimes Elles, S.J.; Jashal, B.K.; Martinez-Vidal, F.; Oyanguren, A.; Rebollo De Miguel, M.; Sanderswood, I.; Zhuo, J. url  doi
openurl 
  Title Helium identification with LHCb Type Journal Article
  Year 2024 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 19 Issue 2 Pages P02010 - 23pp  
  Keywords dE/dx detectors; Ion identification systems; Large detector systems for particle and astroparticle physics; Particle identification methods  
  Abstract The identification of helium nuclei at LHCb is achieved using a method based on measurements of ionisation losses in the silicon sensors and timing measurements in the Outer Tracker drift tubes. The background from photon conversions is reduced using the RICH detectors and an isolation requirement. The method is developed using pp collision data at root s = 13 TeV recorded by the LHCb experiment in the years 2016 to 2018, corresponding to an integrated luminosity of 5.5 fb(-1). A total of around 10(5) helium and antihelium candidates are identified with negligible background contamination. The helium identification efficiency is estimated to be approximately 50% with a corresponding background rejection rate of up to O(10(12)). These results demonstrate the feasibility of a rich programme of measurements of QCD and astrophysics interest involving light nuclei.  
  Address [Egede, U.; Fujii, Y.; Hadavizadeh, T.; Henderson, R. D. L.; Lane, J. J.; Monk, M.; Song, R.; Walton, E. J.; Ward, J. A.] Monash Univ, Sch Phys & Astron, Melbourne, Vic, Australia, Email: rmoise@cern.ch  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001185791500006 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 6068  
Permanent link to this record
 

 
Author (up) NEXT Collaboration (Navarro, K.E. et al); Carcel, S.; Carrion, J.V.; Lopez, F.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. url  doi
openurl 
  Title A compact dication source for Ba2+ tagging and heavy metal ion sensor development Type Journal Article
  Year 2023 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 18 Issue 7 Pages P07044 - 19pp  
  Keywords Beam Optics; Heavy-ion detectors; Ion identification systems; Ion sources (positive ions; negative ions; electron cyclotron resonance (ECR); electron beam (EBIS))  
  Abstract We present a tunable metal ion beam that delivers controllable ion currents in the picoamp range for testing of dry-phase ion sensors. Ion beams are formed by sequential atomic evaporation and single or multiple electron impact ionization, followed by acceleration into a sensing region. Controllability of the ionic charge state is achieved through tuning of electrode potentials that influence the retention time in the ionization region. Barium, lead, and cadmium samples have been used to test the system, with ion currents identified and quantified using a quadrupole mass analyzer. Realization of a clean Ba2+ ion beam within a bench-top system represents an important technical advance toward the development and characterization of barium tagging systems for neutrinoless double beta decay searches in xenon gas. This system also provides a testbed for investigation of novel ion sensing methodologies for environmental assay applications, with dication beams of Pb2+ and Cd2+ also demonstrated for this purpose.  
  Address [Navarro, K. E.; Baeza-Rubio, J.; Giri, S.; Jones, B. J. P.; Nygren, D. R.; Samaniego, F. J.; Stogsdill, K.; Tiscareno, M. R.; Byrnes, N.; Dey, E.; Mistry, K.; Parmaksiz, I.] Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA, Email: karen.navarro@uta.edu  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001106703500002 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5860  
Permanent link to this record
 

 
Author (up) Nygren, D.R.; Jones, B.J.P.; Lopez-March, N.; Mei, Y.; Psihas, F.; Renner, J. url  doi
openurl 
  Title Neutrinoless double beta decay with 82SeF6 and direct ion imaging Type Journal Article
  Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 13 Issue Pages P03015 - 23pp  
  Keywords Charge transport and multiplication in gas; Gaseous detectors; Ion identification systems; Ionization and excitation processes  
  Abstract We present a new neutrinoless double beta decay concept: the high pressure selenium hexafluoride gas time projection chamber. A promising new detection technique is outlined which combines techniques pioneered in high pressure xenon gas, such as topological discrimination, with the high Q-value afforded by the double beta decay isotope Se-82. The lack of free electrons in SeF6 mandates the use of an ion TPC. The microphysics of ion production and drift, which have many nuances, are explored. Background estimates are presented, suggesting that such a detector may achieve background indices of better than 1 count per ton per year in the region of interest at the 100 kg scale, and still better at the ton-scale.  
  Address [Nygren, D. R.; Jones, B. J. P.; Lopez-March, N.; Psihas, F.] Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA, Email: ben.jones@uta.edu  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000428146300005 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3541  
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