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NEXT Collaboration(Kekic, M. et al), Benlloch-Rodriguez, J. M., Carcel, S., Carrion, J. V., Diaz, J., Felkai, R., et al. (2021). Demonstration of background rejection using deep convolutional neural networks in the NEXT experiment. J. High Energy Phys., 01(1), 189–22pp.
Abstract: Convolutional neural networks (CNNs) are widely used state-of-the-art computer vision tools that are becoming increasingly popular in high-energy physics. In this paper, we attempt to understand the potential of CNNs for event classification in the NEXT experiment, which will search for neutrinoless double-beta decay in Xe-136. To do so, we demonstrate the usage of CNNs for the identification of electron-positron pair production events, which exhibit a topology similar to that of a neutrinoless double-beta decay event. These events were produced in the NEXT-White high-pressure xenon TPC using 2.6 MeV gamma rays from a Th-228 calibration source. We train a network on Monte Carlo-simulated events and show that, by applying on-the-fly data augmentation, the network can be made robust against differences between simulation and data. The use of CNNs offers significant improvement in signal efficiency and background rejection when compared to previous non-CNN-based analyses.
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NEXT Collaboration(Simon, A. et al), Felkai, R., Martinez-Lema, G., Sorel, M., Gomez-Cadenas, J. J., Alvarez, V., et al. (2018). Electron drift properties in high pressure gaseous xenon. J. Instrum., 13, P07013–23pp.
Abstract: Gaseous time projection chambers (TPC) are a very attractive detector technology for particle tracking. Characterization of both drift velocity and diffusion is of great importance to correctly assess their tracking capabilities. NEXT-White is a High Pressure Xenon gas TPC with electroluminescent amplification, a 1:2 scale model of the future NEXT-100 detector, which will be dedicated to neutrinoless double beta decay searches. NEXT-White has been operating at Canfranc Underground Laboratory (LSC) since December 2016. The drift parameters have been measured using Kr-83(m) for a range of reduced drift fields at two different pressure regimes, namely 7.2 bar and 9.1 bar. The results have been compared with Magboltz simulations. Agreement at the 5% level or better has been found for drift velocity, longitudinal diffusion and transverse diffusion.
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NEXT Collaboration(Fernandes, A. F. M. et al), Alvarez, V., Benlloch-Rodriguez, J. M., Carcel, S., Carrion, J. V., Diaz, J., et al. (2020). Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield. J. High Energy Phys., 04(4), 034–18pp.
Abstract: High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures.
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NEXT Collaboration(Martinez-Lema, G. et al), Palmeiro, B., Botas, A., Laing, A., Renner, J., Simon, A., et al. (2018). Calibration of the NEXT-White detector using Kr-83m decays. J. Instrum., 13, P10014–21pp.
Abstract: The NEXT-White (NEW) detector is currently the largest radio-pure high-pressure xenon gas time projection chamber with electroluminescent readout in the world. It has been operating at Laboratorio Subterraneo de Canfranc (LSC) since October 2016. This paper describes the calibrations performed using Kr-83m decays during a long run taken from March to November 2017 (Run II). Krypton calibrations are used to correct for the finite drift-electron lifetime as well as for the dependence of the measured energy on the event transverse position which is caused by variations in solid angle coverage both for direct and reflected light and edge effects. After producing calibration maps to correct for both effects we measure an excellent energy resolution for 41.5 keV point-like deposits of (4.553 +/- 0.010 (stat.) +/- 0.324 (sys.)) % FWHM in the full chamber and (3.804 +/- 0.013 (stat.) +/- 0.112 (sys.)) % FWHM in a restricted fiducial volume. Using naive 1/root E scaling, these values translate into resolutions of (0.5916 +/- 0.0014 (stat.) +/- 0.0421 (sys.)) % FWHM and (0.4943 +/- 0.0017 (stat.) +/- 0.0146 (sys.)) % FWHM at the Q(beta beta) energy of xenon double beta decay (2458 keV), well within range of our target value of 1%.
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NEXT Collaboration(Ghosh, S. et al), Martin-Albo, J., Carcel, S., Carrion, J. V., Diaz, J., Felkai, R., et al. (2020). Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air. J. Instrum., 15(11), P11031–16pp.
Abstract: Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
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