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NEXT Collaboration (Rogers, L. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
High voltage insulation and gas absorption of polymers in high pressure argon and xenon gases |
Type |
Journal Article |
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Year |
2018 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
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Volume |
13 |
Issue |
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Pages |
P10002 - 19pp |
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Keywords |
Gaseous detectors; Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators) |
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Abstract |
High pressure gas time projection chambers (HPGTPCs) are made with a variety of materials, many of which still await proper characterization in high pressure noble gas environments. As HPGTPCs increase in size toward ton-scale detectors, assemblies become larger and more complex, creating a need for detailed understanding of how structural supports and high voltage insulators behave. This includes identification of materials with predictable mechanical properties and without surface charge accumulation that may lead to field deformation or sparking. This paper explores the mechanical and electrical effects of high pressure gas environments on insulating polymers PTFE, HDPE, PEEK, POM and UHMW in argon and xenon, including studying gas absorption, swelling and high voltage insulation strength. |
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Address  |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: leslie.rogers@mavs.uta.edu |
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Publisher |
Iop Publishing Ltd |
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English |
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Series Volume |
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ISSN |
1748-0221 |
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Expedition |
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Conference |
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Notes |
WOS:000445999500002 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3744 |
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Author |
NEXT Collaboration (Novella, P. et al); Palmeiro, B.; Simon, A.; Sorel, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Yahlali, N. |
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Title |
Measurement of radon-induced backgrounds in the NEXT double beta decay experiment |
Type |
Journal Article |
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Year |
2018 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
10 |
Issue |
10 |
Pages |
112 - 27pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments) |
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Abstract |
The measurement of the internal Rn-222 activity in the NEXT-White detector during the so-called Run-II period with Xe-136-depleted xenon is discussed in detail, together with its implications for double beta decay searches in NEXT. The activity is measured through the alpha production rate induced in the fiducial volume by Rn-222 and its alpha-emitting progeny. The specific activity is measured to be (38.1 +/- 2.2 (stat.) +/- 5.9 (syst.)) mBq/m(3). Radon-induced electrons have also been characterized from the decay of the Bi-214 daughter ions plating out on the cathode of the time projection chamber. From our studies, we conclude that radon-induced backgrounds are sufficiently low to enable a successful NEXT-100 physics program, as the projected rate contribution should not exceed 0.1 counts/yr in the neutrinoless double beta decay sample. |
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Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: sorel@ific.uv.es |
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Springer |
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English |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Expedition |
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Conference |
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Notes |
WOS:000448191500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3779 |
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Author |
NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
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Title |
Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection |
Type |
Journal Article |
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Year |
2017 |
Publication |
Physics Letters B |
Abbreviated Journal |
Phys. Lett. B |
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Volume |
773 |
Issue |
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Pages |
663-671 |
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Keywords |
Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon |
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Abstract |
Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2. |
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Address |
[Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt |
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Publisher |
Elsevier Science Bv |
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English |
Summary Language |
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Original Title |
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Series Issue |
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Edition |
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ISSN |
0370-2693 |
ISBN |
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Conference |
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Notes |
WOS:000413294200099 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3342 |
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Author |
NEXT Collaboration (Henriques, C.A.O. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C.; Simon, A.; Sorel, M.; Yahlali, N. |
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Title |
Electroluminescence TPCs at the thermal diffusion limit |
Type |
Journal Article |
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Year |
2019 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
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Volume |
01 |
Issue |
1 |
Pages |
027 - 23pp |
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Keywords |
Dark Matter and Double Beta Decay (experiments); Photon production; Particle correlations and fluctuations; Rare decay |
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Abstract |
The NEXT experiment aims at searching for the hypothetical neutrinoless double-beta decay from the Xe-136 isotope using a high-purity xenon TPC. Efficient discrimination of the events through pattern recognition of the topology of primary ionisation tracks is a major requirement for the experiment. However, it is limited by the diffusion of electrons. It is known that the addition of a small fraction of a molecular gas to xenon reduces electron diffusion. On the other hand, the electroluminescence (EL) yield drops and the achievable energy resolution may be compromised. We have studied the effect of adding several molecular gases to xenon (CO2, CH4 and CF4) on the EL yield and energy resolution obtained in a small prototype of driftless gas proportional scintillation counter. We have compared our results on the scintillation characteristics (EL yield and energy resolution) with a microscopic simulation, obtaining the diffusion coefficients in those conditions as well. Accordingly, electron diffusion may be reduced from about 10 for pure xenon down to 2.5 using additive concentrations of about 0.05%, 0.2% and 0.02% for CO2, CH4 and CF4, respectively. Our results show that CF4 admixtures present the highest EL yield in those conditions, but very poor energy resolution as a result of huge fluctuations observed in the EL formation. CH4 presents the best energy resolution despite the EL yield being the lowest. The results obtained with xenon admixtures are extrapolated to the operational conditions of the NEXT-100 TPC. CO2 and CH4 show potential as molecular additives in a large xenon TPC. While CO2 has some operational constraints, making it difficult to be used in a large TPC, CH4 shows the best performance and stability as molecular additive to be used in the NEXT-100 TPC, with an extrapolated energy resolution of 0.4% at 2.45 MeV for concentrations below 0.4%, which is only slightly worse than the one obtained for pure xenon. We demonstrate the possibility to have an electroluminescence TPC operating very close to the thermal diffusion limit without jeopardizing the TPC performance, if CO2 or CH4 are chosen as additives. |
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Address |
[Henriques, C. A. O.; Monteiro, C. M. B.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, A. F. M.; Fernandes, L. M. P.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: pancho@gian.fis.uc.pt |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000455157300002 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
3873 |
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Author |
Cervera-Villanueva, A.; Laing, A.; Martin-Albo, J.; Soler, F.J.P. |
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Title |
Performance of the MIND detector at a Neutrino Factory using realistic muon reconstruction |
Type |
Journal Article |
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Year |
2010 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
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Volume |
624 |
Issue |
3 |
Pages |
601-614 |
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Keywords |
Neutrino Factory; Detector; Neutrino oscillation |
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Abstract |
A Neutrino Factory producing an intense beam composed of v(e)((v) over bar (e)) and (v) over bar (mu)(v(mu)) from muon decays has been shown to have the greatest sensitivity to the two currently unmeasured neutrino mixing parameters theta(13) and delta(CP) Using the wrong-sign muon signal to measure v(e)-> v(mu)((v) over bar (e) ->(v) over bar (mu)) oscillations in a 50kt Magnetised Iron Neutrino Detector (MIND) sensitivity to delta(CP) could be maintained down to small values of theta(13) However the detector efficiencies used in these previous studies were calculated assuming perfect pattern recognition In this paper MIND is reassessed taking into account for the first time a realistic pattern recognition for the muon candidate Reoptimisation of the analysis utilises a combination of methods including a multivariate analysis similar to the one used in MINOS to maintain high efficiency while suppressing backgrounds ensuring that the signal selection efficiency and the background levels are comparable or better than the ones in previous analyses As a result MIND remains the most sensitive future facility for the discovery of CP violation from neutrino oscillations. |
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Address |
[Laing, A.; Soler, F. J. P.] Univ Glasgow, Sch Phys & Astron, Glasgow, Lanark, Scotland |
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Corporate Author |
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Thesis |
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Publisher |
Elsevier Science Bv |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0168-9002 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
ISI:000285370600008 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ elepoucu @ |
Serial |
309 |
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