Records |
Author |
NEXT Collaboration (Rogers, L. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
Title |
High voltage insulation and gas absorption of polymers in high pressure argon and xenon gases |
Type |
Journal Article |
Year |
2018 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
Volume |
13 |
Issue |
|
Pages |
P10002 - 19pp |
Keywords |
Gaseous detectors; Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators) |
Abstract |
High pressure gas time projection chambers (HPGTPCs) are made with a variety of materials, many of which still await proper characterization in high pressure noble gas environments. As HPGTPCs increase in size toward ton-scale detectors, assemblies become larger and more complex, creating a need for detailed understanding of how structural supports and high voltage insulators behave. This includes identification of materials with predictable mechanical properties and without surface charge accumulation that may lead to field deformation or sparking. This paper explores the mechanical and electrical effects of high pressure gas environments on insulating polymers PTFE, HDPE, PEEK, POM and UHMW in argon and xenon, including studying gas absorption, swelling and high voltage insulation strength. |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: leslie.rogers@mavs.uta.edu |
Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000445999500002 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
3744 |
Permanent link to this record |
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Author |
NEXT Collaboration (Renner, J. et al); Kekic, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Lopez-March, N.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Title |
Energy calibration of the NEXT-White detector with 1% resolution near Q(beta beta) of Xe-136 |
Type |
Journal Article |
Year |
2019 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
Volume |
10 |
Issue |
10 |
Pages |
230 - 13pp |
Keywords |
Dark Matter and Double Beta Decay (experiments) |
Abstract |
Excellent energy resolution is one of the primary advantages of electroluminescent high-pressure xenon TPCs. These detectors are promising tools in searching for rare physics events, such as neutrinoless double-beta decay (beta beta 0 nu), which require precise energy measurements. Using the NEXT-White detector, developed by the NEXT (Neutrino Experiment with a Xenon TPC) collaboration, we show for the first time that an energy resolution of 1% FWHM can be achieved at 2.6 MeV, establishing the present technology as the one with the best energy resolution of all xenon detectors for beta beta 0 nu searches. |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: josren@uv.es |
Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000492984100001 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
4188 |
Permanent link to this record |
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Author |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Title |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
Type |
Journal Article |
Year |
2020 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
Volume |
15 |
Issue |
11 |
Pages |
P11031 - 16pp |
Keywords |
Detector design and construction technologies and materials; Double-beta decay detectors; Time projection Chambers (TPC) |
Abstract |
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance. |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: jhaefner@g.harvard.edu |
Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
|
Notes |
WOS:000595650800024 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
4633 |
Permanent link to this record |
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Author |
NEXT Collaboration (Martinez-Lema, G. et al); Palmeiro, B.; Botas, A.; Laing, A.; Renner, J.; Simon, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Lugue, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
Title |
Calibration of the NEXT-White detector using Kr-83m decays |
Type |
Journal Article |
Year |
2018 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
Volume |
13 |
Issue |
|
Pages |
P10014 - 21pp |
Keywords |
Charge transport; multiplication and electroluminescence in rare gases and liquids; Gaseous imaging and tracking detectors; Time projection Chambers (TPC); Double-beta decay detectors |
Abstract |
The NEXT-White (NEW) detector is currently the largest radio-pure high-pressure xenon gas time projection chamber with electroluminescent readout in the world. It has been operating at Laboratorio Subterraneo de Canfranc (LSC) since October 2016. This paper describes the calibrations performed using Kr-83m decays during a long run taken from March to November 2017 (Run II). Krypton calibrations are used to correct for the finite drift-electron lifetime as well as for the dependence of the measured energy on the event transverse position which is caused by variations in solid angle coverage both for direct and reflected light and edge effects. After producing calibration maps to correct for both effects we measure an excellent energy resolution for 41.5 keV point-like deposits of (4.553 +/- 0.010 (stat.) +/- 0.324 (sys.)) % FWHM in the full chamber and (3.804 +/- 0.013 (stat.) +/- 0.112 (sys.)) % FWHM in a restricted fiducial volume. Using naive 1/root E scaling, these values translate into resolutions of (0.5916 +/- 0.0014 (stat.) +/- 0.0421 (sys.)) % FWHM and (0.4943 +/- 0.0017 (stat.) +/- 0.0146 (sys.)) % FWHM at the Q(beta beta) energy of xenon double beta decay (2458 keV), well within range of our target value of 1%. |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: gonzalo.martinez.lema@usc.es |
Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000447061800001 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
3754 |
Permanent link to this record |
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Author |
NEXT Collaboration (Fernandes, A.F.M. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Title |
Low-diffusion Xe-He gas mixtures for rare-event detection: electroluminescence yield |
Type |
Journal Article |
Year |
2020 |
Publication |
Journal of High Energy Physics |
Abbreviated Journal |
J. High Energy Phys. |
Volume |
04 |
Issue |
4 |
Pages |
034 - 18pp |
Keywords |
Particle correlations and fluctuations; Photon production; Dark Matter and Double Beta Decay (experiments); Rare decay |
Abstract |
High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionisation trails is a major asset for this type of TPC when compared to single liquid or double-phase TPCs, limited mainly by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffu- sion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence (EL) yield of Xe-He mixtures, in the range of 0 to 30% He and demonstrated the small impact on the EL yield of the addition of helium to pure xenon. For a typical reduced electric field of 2.5 kV/cm/bar in the EL region, the EL yield is lowered by similar to 2%, 3%, 6% and 10% for 10%, 15%, 20% and 30% of helium concentration, respectively. This decrease is less than what has been obtained from the most recent simulation framework in the literature. The impact of the addition of helium on EL statistical fluctuations is negligible, within the experimental uncertainties. The present results are an important benchmark for the simulation tools to be applied to future optical TPCs based on Xe-He mixtures. |
Address |
[Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: cristinam@uc.pt |
Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1029-8479 |
ISBN |
|
Medium |
|
Area |
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Expedition |
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Conference |
|
Notes |
WOS:000525257400001 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
4366 |
Permanent link to this record |