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NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. Initial results of NEXT-DEMO, a large-scale prototype of the NEXT-100 experiment 2013 Journal of Instrumentation 8 P04002 - 25pp details   doi
NEXT Collaboration (Simon, A. et al); Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. Boosting background suppression in the NEXT experiment through Richardson-Lucy deconvolution 2021 Journal of High Energy Physics 07 146 - 38pp details   doi
NEXT Collaboration (Haefner, J. et al); Carcel, S.; Carrion, J.V.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A. Demonstration of event position reconstruction based on diffusion in the NEXT-white detector 2024 European Physical Journal C 84 518 - 13pp details   doi
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air 2020 Journal of Instrumentation 15 P11031 - 16pp details   doi
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness 2023 Journal of Instrumentation 18 P03016 - 21pp details   doi
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