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Pilsl, B.; Bergauer, T.; Casanova, R.; Handerkas, H.; Irmler, C.; Kraemer, U.; Marco-Hernandez, R.; Mazorra de Cos, J.; Palomo, F.R.; Portschy, S.; Powell, S.; Sieberer, P.; Sonneveld, J.; Steininger, H.; Vilella, E.; Wade, B.; Zhang, C.; Zhang, S. Enhancing radiation hardness and granularity in HV-CMOS: The RD50-MPW4 sensor 2025 Nuclear Instruments & Methods in Physics Research A 1080 170752 - 5pp details   doi
Zhang, S.C.; Duan, M.Y.; Lyu, W.T.; Wang, G.Y.; Zhu, J.Y.; Wang, E. Explore the properties of Λ(1670) in the Cabibbo-favored process Λc+ → p K- π+ 2024 European Physical Journal C 84 1253 - 8pp details   doi
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