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Author
Title
Year
Publication
Volume
Pages
Poley, L.
;
Blue, A.
;
Bloch, I.
;
Buttar, C.
;
Fadeyev, V.
;
Fernandez-Tejero, J.
;
Fleta, C.
;
Hacker, J.
;
Lacasta, C.
;
Miñano, M.
;
Renzmann, M.
;
Rossi, E.
;
Sawyer, C.
;
Sperlich, D.
;
Stegler, M.
;
Ullan, M.
;
Unno, Y.
Mapping the depleted area of silicon diodes using a micro-focused X-ray beam
2019
Journal of Instrumentation
14
P03024 - 14pp
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