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Author
Title
Year
Publication
Volume
Pages
Renner, J.
;
Wright, M.A.
;
Bouchard, K.
;
Cohen, B.E.
;
Ercius, P.
;
Goldschmidt, A.
;
Pedroso, C.C.S.
;
Saha, A.
;
Denes, P.
Robust electron counting for direct electron detectors with the Back-propagation counting method
2026
npj Computational Materials
12
244 - 10pp
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